 | 2012 |
|---|
| 7 |       | Pierre-Didier Mauroux,
Arnaud Virazel,
Alberto Bosio,
Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Benoît Godard,
Gilles Festes,
Laurent Vachez:
Analysis and Fault Modeling of Actual Resistive Defects in ATMEL [InlineMediaObject not available: see fulltext.] eFlash Memories.
J. Electronic Testing 28(2): 215-228 (2012) |
| 2011 |
|---|
| 6 | | Pierre-Didier Mauroux,
Arnaud Virazel,
Alberto Bosio,
Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Benoît Godard,
Gilles Festes,
Laurent Vachez:
On using a SPICE-like TSTAC™ eFlash model for design and test.
DDECS 2011: 359-364 |
| 2010 |
|---|
| 5 | | Pierre-Didier Mauroux,
Arnaud Virazel,
Alberto Bosio,
Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Benoît Godard,
Gilles Festes,
Laurent Vachez:
A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction.
European Test Symposium 2010: 81-86 |
| 2009 |
|---|
| 4 | | Pierre-Didier Mauroux,
Arnaud Virazel,
Alberto Bosio,
Luigi Dilillo,
Patrick Girard,
Serge Pravossoudovitch,
Benoît Godard:
NAND flash testing: A preliminary study on actual defects.
ITC 2009: 1 |
| 2008 |
|---|
| 3 | | Benoît Godard,
Jean Michel Daga,
Lionel Torres,
Gilles Sassatelli:
Hierarchical Code Correction and Reliability Management in Embedded nor Flash Memories.
European Test Symposium 2008: 84-90 |
| 2007 |
|---|
| 2 | | Benoît Godard,
Jean Michel Daga,
Lionel Torres,
Gilles Sassatelli:
Evaluation of design for reliability techniques in embedded flash memories.
DATE 2007: 1593-1598 |
| 1 |  | Benoît Godard,
Jean Michel Daga,
Lionel Torres,
Gilles Sassatelli:
Architecture for Highly Reliable Embedded Flash Memories.
DDECS 2007: 75-80 |
Data released under the ODC-BY 1.0 license — See also our legal information page