Andreas Glowatz

	2011
13		Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, M. Reese, J. Rearick, Jason Rivers: Cell-aware analysis for small-delay effects and production test results from different fault models. ITC 2011: 1-8
	2010
12		Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, Stefan Eichenberger: Defect-oriented cell-internal testing. ITC 2010: 285-294
11		Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Rolf Drechsler: MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple-Valued Logics. J. Electronic Testing 26(3): 307-322 (2010)
	2009
10		Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson: Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC 2009: 1-10
9		Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jürgen Schlöffel, Friedrich Hapke, Andreas Glowatz: Restrict Encoding for Mixed-Mode BIST. VTS 2009: 179-184
	2008
8		Rolf Drechsler, Stephan Eggersglüß, Görschwin Fey, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Daniel Tille: On Acceleration of SAT-Based ATPG for Industrial Designs. IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1329-1333 (2008)
	2007
7		Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel: Computation and Application of Absolute Dominators in Industrial Designs. European Test Symposium 2007: 137-144
6		Stephan Eggersglüß, Daniel Tille, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: Experimental Studies on SAT-Based ATPG for Gate Delay Faults. ISMVL 2007: 6
5		Jeroen Geuzebroek, Erik Jan Marinissen, Ananta K. Majhi, Andreas Glowatz, Friedrich Hapke: Embedded multi-detect ATPG and Its Effect on the Detection of Unmodeled Defects. ITC 2007: 1-10
4		Abdul Wahid Hakmi, Hans-Joachim Wunderlich, Christian G. Zoellin, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel, Laurent Souef: Programmable deterministic Built-In Self-Test. ITC 2007: 1-9
3		Stephan Eggersglüß, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: Combining Multi-Valued Logics in SAT-based ATPG for Path Delay Faults. MEMOCODE 2007: 181-187
	2006
2		Harald P. E. Vranken, Sandeep Kumar Goel, Andreas Glowatz, Jürgen Schlöffel, Friedrich Hapke: Fault detection and diagnosis with parity trees for space compaction of test responses. DAC 2006: 1095-1098
	2005
1		Junhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel: PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ISVLSI 2005: 212-217

Coauthor Index

1	Dan Adolfsson	[10]
2	Rolf Drechsler	[1] [3] [6] [8] [11]
3	Stephan Eggersglüß	[3] [6] [8] [11]
4	Stefan Eichenberger	[10] [12]
5	Görschwin Fey	[1] [3] [6] [8] [11]
6	Jeroen Geuzebroek	[5]
7	Sandeep Kumar Goel	[2]
8	Abdul Wahid Hakmi	[4] [9]
9	Friedrich Hapke	[1] [2] [3] [4] [5] [6] [8] [9] [10] [11] [12] [13]
10	Hamidreza Hashempour	[10] [12]
11	Stefan Holst	[9]
12	Camelia Hora	[10]
13	Rene Krenz-Baath	[7] [10] [12]
14	Ananta K. Majhi	[5]
15	Erik Jan Marinissen	[5]
16	Janusz Rajski	[13]
17	J. Rearick	[13]
18	Wilfried Redemund	[12] [13]
19	M. Reese	[13]
20	Jason Rivers	[13]
21	Jürgen Schlöffel	[1] [2] [3] [4] [6] [7] [8] [9] [10] [11] [12] [13]
22	Junhao Shi	[1]
23	Laurent Souef	[4]
24	Daniel Tille	[6] [8]
25	Harald P. E. Vranken	[2]
26	Michael Wittke	[12]
27	Hans-Joachim Wunderlich	[4] [9]
28	Christian G. Zoellin	[4]

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