Arkadiusz Glowacki

	2011
6		Ponky Ivo, Arkadiusz Glowacki, Eldad Bahat-Treidel, Richard Lossy, Joachim Würfl, Christian Boit, Günther Tränkle: Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements. Microelectronics Reliability 51(2): 217-223 (2011)
5		Arkadiusz Glowacki, Christian Boit, Philippe Perdu: Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. Microelectronics Reliability 51(9-11): 1632-1636 (2011)
4		Sanjib Kumar Brahma, Arkadiusz Glowacki, Reiner Leihkauf, Christian Boit: Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation. Microelectronics Reliability 51(9-11): 1652-1657 (2011)
	2009
3		Arkadiusz Glowacki, Piotr Laskowski, Christian Boit, Ponky Ivo, Eldad Bahat-Treidel, Reza Pazirandeh, Richard Lossy, Joachim Würfl, Günther Tränkle: Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures. Microelectronics Reliability 49(9-11): 1211-1215 (2009)
	2008
2		Piotr Laskowski, Arkadiusz Glowacki, Christian Boit: Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits. Microelectronics Reliability 48(8-9): 1295-1299 (2008)
	2005
1		Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki: Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout. Microelectronics Reliability 45(9-11): 1487-1492 (2005)

Coauthor Index

1	Eldad Bahat-Treidel	[3] [6]
2	Christian Boit	[1] [2] [3] [4] [5] [6]
3	Sanjib Kumar Brahma	[1] [4]
4	Ponky Ivo	[3] [6]
5	Piotr Laskowski	[2] [3]
6	Reiner Leihkauf	[4]
7	Richard Lossy	[3] [6]
8	Reza Pazirandeh	[3]
9	Philippe Perdu	[5]
10	Günther Tränkle	[3] [6]
11	Joachim Würfl	[3] [6]

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page