G. Giusto

	2005
3		G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia: Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability 45(5-6): 857-860 (2005)
2		G. Ghidini, C. Capolupo, G. Giusto, A. Sebastiani, B. Stragliati, M. Vitali: Tunnel oxide degradation under pulsed stress. Microelectronics Reliability 45(9-11): 1337-1342 (2005)
	2003
1		G. Ghidini, A. Garavaglia, G. Giusto, A. Ghetti, R. Bottini, D. Peschiaroli, M. Scaravaggi, F. Cazzaniga, D. Ielmini: Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET. Microelectronics Reliability 43(8): 1221-1227 (2003)

Coauthor Index

1	R. Bottini	[1] [3]
2	D. Brazzelli	[3]
3	C. Capolupo	[2]
4	F. Cazzaniga	[1]
5	N. Galbiati	[3]
6	A. Garavaglia	[1] [3]
7	A. Ghetti	[1] [3]
8	G. Ghidini	[1] [2] [3]
9	D. Ielmini	[1]
10	M. Langenbuch	[3]
11	D. Peschiaroli	[1]
12	M. Scaravaggi	[1]
13	A. Sebastiani	[2]
14	B. Stragliati	[2]
15	M. Vitali	[2]

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