![]() | ![]() |
| 2001 | ||
|---|---|---|
| 1 | M. N. Levin, V. R. Gitlin, S. G. Kadmensky, S. S. Ostrouhov, V. S. Pershenkov: X-ray and UV controlled adjustment of MOS VLSI circuits threshold voltages. Microelectronics Reliability 41(2): 185-191 (2001) | |
| 1 | S. G. Kadmensky | [1] |
| 2 | M. N. Levin | [1] |
| 3 | S. S. Ostrouhov | [1] |
| 4 | V. S. Pershenkov | [1] |
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