Patrick Girard

	2012
162		J. Azevedo, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri-Sanial, G. Prenat, Jérémy Alvarez-Herault, Ken Mackay: Impact of resistive-open defects on the heat current of TAS-MRAM architectures. DATE 2012: 532-537
161		Junxia Ma, Mohammad Tehranipoor, Patrick Girard: A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk. J. Electronic Testing 28(2): 201-214 (2012)
160		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: Analysis and Fault Modeling of Actual Resistive Defects in ATMEL [InlineMediaObject not available: see fulltext.] eFlash Memories. J. Electronic Testing 28(2): 215-228 (2012)
159		Hassan Salmani, Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty, Patrick Girard, Xiaoqing Wen: Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of Transition Delay Fault Patterns. J. Low Power Electronics 8(2): 248-258 (2012)
	2011
158		D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Hans-Joachim Wunderlich: A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits. Asian Test Symposium 2011: 136-141
157		Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine: Failure Analysis and Test Solutions for Low-Power SRAMs. Asian Test Symposium 2011: 459-460
156		Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Kohei Miyase, X. Wen: Power-Aware Test Pattern Generation for At-Speed LOS Testing. Asian Test Symposium 2011: 506-510
155		Kohei Miyase, Y. Uchinodan, Kazunari Enokimoto, Yuta Yamato, Xiaoqing Wen, Seiji Kajihara, Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Arnaud Virazel: Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling. Asian Test Symposium 2011: 90-95
154		Aida Todri, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: A study of path delay variations in the presence of uncorrelated power and ground supply noise. DDECS 2011: 189-194
153		Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling. DDECS 2011: 353-358
152		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: On using a SPICE-like TSTAC™ eFlash model for design and test. DDECS 2011: 359-364
151		Paolo Bernardi, Matteo Sonza Reorda, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch: On the Modeling of Gate Delay Faults by Means of Transition Delay Faults. DFT 2011: 226-232
150		Luigi Dilillo, Alberto Bosio, Miroslav Valka, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: Error Resilient Infrastructure for Data Transfer in a Distributed Neutron Detector. DFT 2011: 294-301
149		Jeremy Seligman, Fenrong Liu, Patrick Girard: Logic in the Community. ICLA 2011: 178-188
148		Thomas Lachaume, Patrick Girard, Laurent Guittet, Allan Fousse: Prototypage basé sur les modèles de tâches: une étude pilote. IHM 2011: 23
147		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: On using address scrambling to implement defect tolerance in SRAMs. ITC 2011: 1-8
146		Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor: Power-aware test generation with guaranteed launch safety for at-speed scan testing. VTS 2011: 166-171
145		Sybille Caffiau, Patrick Girard, Laurent Guittet, X. Blanc: Vérification de cohérence entre modèles de tâches et de dialogue en conception centrée-utilisateur. Ingénierie des Systèmes d'Information 16(5): 9-41 (2011)
	2010
144		Junxia Ma, Jeremy Lee, Mohammad Tehranipoor, Nisar Ahmed, Patrick Girard: Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric. ACM Great Lakes Symposium on VLSI 2010: 127-130
143		Paolo Rech, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Luigi Dilillo: A Memory Fault Simulator for Radiation-Induced Effects in SRAMs. Asian Test Symposium 2010: 100-105
142		Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Olivia Riewer: A Comprehensive System-on-Chip Logic Diagnosis. Asian Test Symposium 2010: 237-242
141		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: A statistical simulation method for reliability analysis of SRAM core-cells. DAC 2010: 853-856
140		Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao, Mohammad Tehranipoor, Xiaoqing Wen: Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes. DDECS 2010: 376-381
139		Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda: An Exact and Efficient Critical Path Tracing Algorithm. DELTA 2010: 164-169
138		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Impact of Resistive-Bridging Defects in SRAM Core-Cell. DELTA 2010: 265-269
137		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes. European Test Symposium 2010: 132-137
136		Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine: Setting test conditions for improving SRAM reliability. European Test Symposium 2010: 257
135		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard, Gilles Festes, Laurent Vachez: A two-layer SPICE model of the ATMEL TSTACTM eFlash memory technology for defect injection and faulty behavior prediction. European Test Symposium 2010: 81-86
134		Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed: Is test power reduction through X-filling good enough? ITC 2010: 805
133		Jean Marc Gallière, Paolo Rech, Patrick Girard, Luigi Dilillo: A roaming memory test bench for detecting particle induced SEUs. ITC 2010: 810
132		D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Hans-Joachim Wunderlich: Parity prediction synthesis for nano-electronic gate designs. ITC 2010: 820
131		Adrien Marion, Patrick Girard, Didier Vray: Quaternionic Spatiotemporal Filtering for Dense Motion Field Estimation in Ultrasound Imaging. EURASIP J. Adv. Sig. Proc. 2010: (2010)
130		Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: A Comprehensive Framework for Logic Diagnosis of Arbitrary Defects. IEEE Trans. Computers 59(3): 289-300 (2010)
129		Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor: High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme. IEICE Transactions 93-D(1): 2-9 (2010)
128		Sybille Caffiau, Dominique L. Scapin, Patrick Girard, Mickaël Baron, Francis Jambon: Increasing the expressive power of task analysis: Systematic comparison and empirical assessment of tool-supported task models. Interacting with Computers 22(6): 569-593 (2010)
127		Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Xiaoqing Wen, Nisar Ahmed: A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes. J. Low Power Electronics 6(2): 359-374 (2010)
	2009
126		Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Olivia Riewer: Delay Fault Diagnosis in Sequential Circuits. Asian Test Symposium 2009: 355-360
125		Alexandre Ney, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: A new design-for-test technique for SRAM core-cell stability faults. DATE 2009: 1344-1348
124		Youssef Benabboud, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Laroussi Bouzaida, Isabelle Izaute: Comprehensive bridging fault diagnosis based on the SLAT paradigm. DDECS 2009: 264-269
123		Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi, Matteo Sonza Reorda: An efficient fault simulation technique for transition faults in non-scan sequential circuits. DDECS 2009: 50-55
122		Christophe Kolski, Peter Forbrig, Bertrand David, Patrick Girard, Chi Dung Tran, Houcine Ezzedine: Agent-Based Architecture for Interactive System Design: Current Approaches, Perspectives and Evaluation. HCI (1) 2009: 624-633
121		Sybille Caffiau, Patrick Girard, Laurent Guittet, Dominique L. Scapin: Hierarchical Structure: A Step for Jointly Designing Interactive Software Dialog and Task Model. HCI (2) 2009: 664-673
120		Patrick Girard, Jeremy Seligman: An Analytic Logic of Aggregation. ICLA 2009: 146-161
119		Youssef Benabboud, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Laroussi Bouzaida, Isabelle Izaute: A case study on logic diagnosis for System-on-Chip. ISQED 2009: 253-259
118		Pierre-Didier Mauroux, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Benoît Godard: NAND flash testing: A preliminary study on actual defects. ITC 2009: 1
117		Sybille Caffiau, Patrick Girard, Dominique L. Scapin, Laurent Guittet, Loé Sanou: Formally Expressing the Users' Objects World in Task Models. TAMODIA 2009: 117-130
116		Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Analysis of Resistive-Open Defects in SRAM Sense Amplifiers. IEEE Trans. VLSI Syst. 17(10): 1556-1559 (2009)
115		Julien Vial, Arnaud Virazel, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Is triple modular redundancy suitable for yield improvement? IET Computers & Digital Techniques 3(6): 581-592 (2009)
114		Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash. J. Electronic Testing 25(2-3): 127-144 (2009)
113		Johan van Benthem, Patrick Girard, Olivier Roy: Everything Else Being Equal: A Modal Logic for Ceteris Paribus Preferences. J. Philosophical Logic 38(1): 83-125 (2009)
	2008
112		Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: A Design-for-Diagnosis Technique for SRAM Write Drivers. DATE 2008: 1480-1485
111		Dimitris Gizopoulos, Kaushik Roy, Patrick Girard, Nicola Nicolici, Xiaoqing Wen: Power-Aware Testing and Test Strategies for Low Power Devices. DATE 2008
110		Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Paolo Bernardi: SoC Symbolic Simulation: a case study on delay fault testing. DDECS 2008: 320-325
109		Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Improving Diagnosis Resolution without Physical Information. DELTA 2008: 210-215
108		Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Using TMR Architectures for Yield Improvement. DFT 2008: 7-15
107		Patrick Girard, Vincent Thomson: Energy Model based Control for Forming Processes. ICINCO-ICSO 2008: 51-59
106		Loé Sanou, Patrick Girard, Laurent Guittet, Sybille Caffiau: Tester la conformité d'une IHM à son modèle de tâches. IHM 2008: 159-162
105		Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Yield Improvement, Fault-Tolerance to the Rescue?. IOLTS 2008: 165-166
104		Julien Vial, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: SoC Yield Improvement: Redundant Architectures to the Rescue? ITC 2008: 1
103		Alexandre Ney, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs. ITC 2008: 1-10
102		Sybille Caffiau, Patrick Girard, Dominique L. Scapin, Laurent Guittet, Loé Sanou: Assessment of Object Use for Task Modeling. TAMODIA/HCSE 2008: 14-28
101		Alexandre Ney, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian, Vincent Gouin: An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. VTS 2008: 89-94
100		Nicola Nicolici, Patrick Girard: Guest Editorial. J. Electronic Testing 24(4): 325-326 (2008)
99		Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault: A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electronic Testing 24(4): 353-364 (2008)
	2007
98		Patrick Girard, Andrzej Krasniewski, Elena Gramatová, Adam Pawlak, Tomasz Garbolino: Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), Kraków, Poland, April 11-13, 2007 IEEE Computer Society 2007
97		Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Slow write driver faults in 65nm SRAM technology: analysis and March test solution. DATE 2007: 528-533
96		Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: A Mixed Approach for Unified Logic Diagnosis. DDECS 2007: 239-242
95		Alexandre Rousset, Alberto Bosio, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: DERRIC: A Tool for Unified Logic Diagnosis. European Test Symposium 2007: 13-20
94		Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories. European Test Symposium 2007: 77-84
93		Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. European Test Symposium 2007: 97-104
92		Olivier Ginez, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Jean Michel Daga: A concurrent approach for testing address decoder faults in eFlash memories. ITC 2007: 1-10
91		Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Tatsuya Suzuki, Yuta Yamato, Patrick Girard, Yuji Ohsumi, Laung-Terng Wang: A novel scheme to reduce power supply noise for high-quality at-speed scan testing. ITC 2007: 1-10
90		Sybille Caffiau, Patrick Girard, Dominique L. Scapin, Laurent Guittet: Generating Interactive Applications from Task Models: A Hard Challenge. TAMODIA 2007: 267-272
89		Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. VTS 2007: 361-368
88		Olivier Ginez, Jean Michel Daga, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window. VTS 2007: 47-52
87		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electronic Testing 23(5): 435-444 (2007)
	2006
86		Luigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard: Minimizing test power in SRAM through reduction of pre-charge activity. DATE 2006: 1159-1164
85		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. DDECS 2006: 256-261
84		Loé Sanou, Patrick Girard, Laurent Guittet: Comparaison de deux méthodes pour implémenter la programmation sur exemple. IHM 2006: 265-268
83		Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Christian Landrault, Arnaud Virazel, Hans-Joachim Wunderlich: Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing. VLSI-SoC 2006: 403-408
82		Olivier Ginez, Jean Michel Daga, Marylene Combe, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: An Overview of Failure Mechanisms in Embedded Flash Memories. VTS 2006: 108-113
81		Zahir Albadawi, Benoit Boulet, Robert DiRaddo, Patrick Girard, Alexandre Rail, Vincent Thomson: Agent-based control of manufacturing processes. IJMR 1(4): 466-481 (2006)
80		Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: A Gated Clock Scheme for Low Power Testing of Logic Cores. J. Electronic Testing 22(1): 89-99 (2006)
79		Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAs. J. Electronic Testing 22(2): 161-172 (2006)
78		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions. J. Electronic Testing 22(3): 287-296 (2006)
77		Luigi Dilillo, Paul M. Rosinger, Bashir M. Al-Hashimi, Patrick Girard: Reducing Power Dissipation in SRAM during Test. J. Low Power Electronics 2(2): 271-280 (2006)
	2005
76		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian: Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. DAC 2005: 857-862
75		Nicolas Guibert, Laurent Guittet, Patrick Girard: Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation. IHM 2005: 147-154
74		Nabil Badereddine, Patrick Girard, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault: Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives. PATMOS 2005: 540-549
73		Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Christian Landrault: Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles. VLSI-SoC 2005: 267-281
72		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian Hage-Hassan: Data Retention Fault in SRAM Memories: Analysis and Detection Procedures. VTS 2005: 183-188
71		Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs. J. Electronic Testing 21(1): 43-55 (2005)
70		Simone Borri, Magali Bastian Hage-Hassan, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel: Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test. J. Electronic Testing 21(2): 169-179 (2005)
69		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories. J. Electronic Testing 21(5): 551-561 (2005)
68		Patrick Girard: Welcome to the Journal of Low Power Electronics. J. Low Power Electronics 1(1): 1-2 (2005)
67		Patrick Girard, Yannick Bonhomme: Low Power Scan Chain Design: A Solution for an Efficient Tradeoff Between Test Power and Scan Routing. J. Low Power Electronics 1(1): 85-95 (2005)
	2004
66		Nicolas Guibert, Patrick Girard, Laurent Guittet: Example-based programming: a pertinent visual approach for learning to program. AVI 2004: 358-361
65		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Bastian Hage-Hassan: Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution. Asian Test Symposium 2004: 266-271
64		Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Design of Routing-Constrained Low Power Scan Chains. DATE 2004: 62-67
63		Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Design of Routing-Constrained Low Power Scan Chains. DELTA 2004: 287-294
62		Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: High Quality TPG for Delay Faults in Look-Up Tables of FPGAs. DELTA 2004: 83-88
61		Yamine Aït Ameur, Benoit Breholée, Patrick Girard, Laurent Guittet, Francis Jambon: Formal Verification and Validation of Interactive Systems Specifications. Human Error, Safety and Systems Development 2004: 61-76
60		Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: BIST of Delay Faults in the Logic Architecture of Symmetrical FPGAs. IOLTS 2004: 187-192
59		Mickaël Baron, Patrick Girard: SUIDT: safe user interface design tool. IUI 2004: 350-351
58		Benoit Boulet, Robert DiRaddo, Patrick Girard, Vincent Thomson: An agent based architecture for model based control. SMC (2) 2004: 2002-2007
57		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: March iC-: An Improved Version of March C- for ADOFs Detection. VTS 2004: 129-138
56		Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: Power-Driven Routing-Constrained Scan Chain Design. J. Electronic Testing 20(6): 647-660 (2004)
	2003
55		Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri: Comparison of Open and Resistive-Open Defect Test Conditions in SRAM Address Decoders. Asian Test Symposium 2003: 250-255
54		Mickaël Baron, Patrick Girard: SUIDT: a user interface builder for secure user interfaces. IHM 2003: 198-201
53		Nicolas Guibert, Patrick Girard: Programming by example and computer-aided teaching of algorithmics: the MELBA project. IHM 2003: 248-251
52		Patrick Girard, Olivier Héron, Serge Pravossoudovitch, Michel Renovell: Defect Analysis for Delay-Fault BIST in FPGAs. IOLTS 2003: 124-128
51		Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint. ITC 2003: 488-493
50		Yamine Aït Ameur, Mickaël Baron, Patrick Girard: Formal Validation of HCI User Tasks. Software Engineering Research and Practice 2003: 732-738
49		Christophe Fagot, Olivier Gascuel, Patrick Girard, Christian Landrault: A Ring Architecture Strategy for BIST Test Pattern Generation. J. Electronic Testing 19(3): 223-231 (2003)
	2002
48		Patrick Girard, Thomas Baudel, Michel Beaudouin-Lafon, Eric Lecolinet, Dominique L. Scapin: Proceedings of the 14th French-speaking conference on Human-computer interactio n, Conference Francophone sur l'Interaction Homme-Machine, IHM 2002, Poitiers, France, November 26-29, 2002 ACM 2002
47		Yannick Bonhomme, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Test Power: a Big Issue in Large SOC Designs. DELTA 2002: 447-449
46		Yannick Bonhomme, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Power Driven Chaining of Flip-Flops in Scan Architectures. ITC 2002: 796-803
45		Mickaël Baron, Patrick Girard: SUIDT: A task model based GUI-Builder. TAMODIA 2002: 64-71
44		René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: On Using Efficient Test Sequences for BIST. VTS 2002: 145-152
43		Patrick Girard: Survey of Low-Power Testing of VLSI Circuits. IEEE Design & Test of Computers 19(3): 82-92 (2002)
42		Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Hans-Joachim Wunderlich: High Defect Coverage with Low-Power Test Sequences in a BIST Environment. IEEE Design & Test of Computers 19(5): 44-52 (2002)
41		René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Hardware Generation of Random Single Input Change Test Sequences. J. Electronic Testing 18(2): 145-157 (2002)
	2001
40		Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Gated Clock Scheme for Low Power Scan Testing of Logic ICs or Embedded Cores. Asian Test Symposium 2001: 253-258
39		Francis Jambon, Patrick Girard, Yamine Aït Ameur: Interactive System Safety and Usability Enforced with the Development Process. EHCI 2001: 39-56
38		Mickaël Baron, Patrick Girard: Bringing Robustness to End-User Programming. HCC 2001: 142-
37		Guillaume Patry, Patrick Girard: End-User Programming in a Structured Dialogue Environment: the GIPSE Project. HCC 2001: 212-
36		Guillaume Texier, Laurent Guittet, Patrick Girard: The dialog tool set: a new way to create the dialog component. HCI 2001: 200-204
35		Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Gated Clock Scheme for Low Power Scan-Based BIST. IOLTW 2001: 87-89
34		René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Random Adjacent Sequences: An Efficient Solution for Logic BIST. VLSI-SOC 2001: 413-424
33		Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Hans-Joachim Wunderlich: A Modified Clock Scheme for a Low Power BIST Test Pattern Generator. VTS 2001: 306-311
32		Arnaud Virazel, René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Delay Fault Testing: Choosing Between Random SIC and Random MIC Test Sequences. J. Electronic Testing 17(3-4): 233-241 (2001)
	2000
31		Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: An adjacency-based test pattern generator for low power BIST design. Asian Test Symposium 2000: 459-464
30		Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel: Comparison between Random and Pseudo-Random Generation for BIST of Delay, Stuck-at and Bridging Faults. IOLTW 2000: 121-126
29		Patrick Girard: Low Power Testing of VLSI Circuits: Problems and Solutions. ISQED 2000: 173-180
28		Patrick Girard, Christian Landrault, Loïs Guiller, Serge Pravossoudovitch: Low power BIST design by hypergraph partitioning: methodology and architectures. ITC 2000: 652-661
27		Laurent Bréhélin, Olivier Gascuel, Gilles Caraux, Patrick Girard, Christian Landrault: Hidden Markov and Independence Models with Patterns for Sequential BIST. VTS 2000: 359-368
26		Salvador Manich, A. Gabarró, M. Lopez, Joan Figueras, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Paulo J. Teixeira, Marcelino B. Santos: Low Power BIST by Filtering Non-Detecting Vectors. J. Electronic Testing 16(3): 193-202 (2000)
	1999
25		Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: Circuit Partitioning for Low Power BIST Design with Minimized Peak Power Consumption. Asian Test Symposium 1999: 89-94
24		Guillaume Patry, Patrick Girard: GIPSE, A Model-Based System for CAD Software. CADUI 1999: 61-72
23		Francis Jambon, Patrick Girard, Yohann Boisdron: Dialogue Validation from Task Analysis. DSV-IS 1999: 205-224
22		Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Test Vector Ordering Technique for Switching Activity Reduction During Test Operation. Great Lakes Symposium on VLSI 1999: 24-
21		Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Joan Figueras, Salvador Manich, Paulo J. Teixeira, Marcelino B. Santos: Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity. ISCAS (1) 1999: 110-113
20		Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch: A Test Vector Inhibiting Technique for Low Energy BIST Design. VTS 1999: 407-412
19		Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel: A Scan-BIST Structure to Test Delay Faults in Sequential Circuits. J. Electronic Testing 14(1-2): 95-102 (1999)
	1998
18		Christophe Fagot, Olivier Gascuel, Patrick Girard, Christian Landrault: A Ring Architecture Strategy for BIST Test Pattern Generation. Asian Test Symposium 1998: 418-423
17		Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch, Arnaud Virazel: A BIST Structure to Test Delay Faults in a Scan Environment. Asian Test Symposium 1998: 435-439
16		Yamine Aït Ameur, Patrick Girard, Francis Jambon: A Uniform Approach for Specification and Design of Interactive Systems: the B Method. DSV-IS (2) 1998: 51-67
15		Yamine Aït Ameur, Patrick Girard, Francis Jambon: Using the B Formal Approach for Incremental Specification Design of Interactiv Systems. EHCI 1998: 91-109
	1997
14		Patrick Girard, Christian Landrault, Serge Pravossoudovitch, D. Severac: A gate resizing technique for high reduction in power consumption. ISLPED 1997: 281-286
13		Christophe Fagot, Patrick Girard, Christian Landrault: On Using Machine Learning for Logic BIST. ITC 1997: 338-346
12		Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch: An optimized BIST test pattern generator for delay testing. VTS 1997: 94-100
11		Patrick Girard, Christian Landrault, Serge Pravossoudovitch, D. Severac: A non-iterative gate resizing algorithm for high reduction in power consumption. Integration 24(1): 37-52 (1997)
	1996
10		Patrick Girard, Christian Landrault, Serge Pravossoudovitch, B. Rodriguez: A Diagnostic ATPG for Delay Faults Based on Genetic Algorithms. ITC 1996: 286-293
9		S. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: A new test pattern generation method for delay fault testing. VTS 1996: 296-301
	1995
8		Yamine Aït Ameur, Frederic Besnard, Patrick Girard, Guy Pierra, Jean-Claude Potier: Formal Specification and Metaprogramming in the EXPRESS Language. SEKE 1995: 181-188
7		Patrick Girard, Christian Landrault, Serge Pravossoudovitch, B. Rodriguez: Diagnostic of path and gate delay faults in non-scan sequential circuits. VTS 1995: 380-386
6		Patrick Girard, Christian Landrault, Serge Pravossoudovitch, B. Rodriguez: Delay fault diagnosis in sequential circuits based on path tracing. Integration 19(3): 199-218 (1995)
5		Patrick Girard, Christian Landrault, Serge Pravossoudovitch: An advanced diagnostic method for delay faults in combinational faulty circuits. J. Electronic Testing 6(3): 277-294 (1995)
	1994
4		D. Dumas, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Effectiveness of a Variable Sampling Time Strategy for Delay Fault Diagnosis. EDAC-ETC-EUROASIC 1994: 518-523
	1993
3		D. Dumas, Patrick Girard, Christian Landrault, Serge Pravossoudovitch: An Implicit Delay-Fault Simulation Method with Approximate Detection Threshold Calculation. ITC 1993: 705-713
	1992
2		Patrick Girard, Christian Landrault, Serge Pravossoudovitch: A Novel Approach to Delay-Fault Diagnosis. DAC 1992: 357-360
1		Patrick Girard, Christian Landrault, Serge Pravossoudovitch: Delay-Fault Diagnosis by Critical-Path Tracing. IEEE Design & Test of Computers 9(4): 27-32 (1992)

Coauthor Index

1	Nisar Ahmed	[127] [134] [144]
2	Bashir M. Al-Hashimi	[77] [86]
3	Zahir Albadawi	[81]
4	Jérémy Alvarez-Herault	[162]
5	Yamine Aït Ameur	[8] [15] [16] [39] [50] [61]
6	J. Azevedo	[162]
7	Nabil Badereddine	[73] [74] [83] [99] [136] [137] [138] [141] [147] [153] [157]
8	Mickaël Baron	[38] [45] [50] [54] [59] [128]
9	Magali Bastian (Magali Bastian Hage-Hassan)	[65] [69] [70] [72] [76] [78] [85] [87] [89] [93] [97] [101] [103] [112] [116] [125]
10	Thomas Baudel	[48]
11	Michel Beaudouin-Lafon	[48]
12	Youssef Benabboud	[119] [124] [126] [142]
13	Johan van Benthem	[113]
14	Paolo Bernardi	[110] [123] [139] [151]
15	Frederic Besnard	[8]
16	X. Blanc	[145]
17	Yohann Boisdron	[23]
18	Yannick Bonhomme	[35] [40] [46] [47] [51] [56] [63] [64] [67] [80]
19	Simone Borri	[55] [57] [65] [69] [70] [78]
20	Alberto Bosio	[95] [96] [103] [104] [105] [108] [109] [110] [115] [118] [119] [123] [124] [126] [127] [130] [132] [134] [135] [136] [137] [138] [139] [140] [141] [142] [143] [147] [150] [151] [152] [153] [154] [155] [156] [157] [158] [160] [162]
21	Benoit Boulet	[58] [81]
22	Laroussi Bouzaida	[119] [124]
23	Laurent Bréhélin	[27]
24	Benoit Breholée	[61]
25	Sybille Caffiau	[90] [102] [106] [117] [121] [128] [145]
26	Gilles Caraux	[27]
27	Krishnendu Chakrabarty	[99]
28	Sreejit Chakravarty	[159]
29	Marylene Combe	[82]
30	S. Cremoux	[9]
31	Jean Michel Daga	[82] [88] [92] [94] [114]
32	Bertrand David (Bertrand T. David)	[122]
33	René David	[32] [34] [41] [44]
34	Robert DiRaddo	[58] [81]
35	Luigi Dilillo	[55] [57] [65] [69] [70] [72] [76] [77] [78] [85] [86] [87] [103] [118] [124] [125] [126] [127] [132] [133] [134] [135] [136] [137] [138] [140] [141] [142] [143] [147] [150] [152] [153] [154] [155] [156] [157] [158] [160] [162]
36	D. Dumas	[3] [4]
37	Kazunari Enokimoto	[146] [155]
38	Houcine Ezzedine	[122]
39	Christophe Fagot	[9] [13] [18] [49]
40	Gilles Festes	[135] [152] [160]
41	Joan Figueras	[21] [26]
42	Renan Alves Fonseca	[136] [137] [138] [141] [147]
43	Peter Forbrig	[122]
44	Allan Fousse	[148]
45	Hiroshi Furukawa	[129]
46	A. Gabarró	[26]
47	Jean Marc Gallière	[133]
48	Tomasz Garbolino	[98]
49	Olivier Gascuel	[18] [27] [49]
50	Olivier Ginez	[82] [88] [92] [94] [114]
51	Dimitris Gizopoulos	[111]
52	Benoît Godard	[118] [135] [152] [160]
53	Vincent Gouin	[101] [112] [125]
54	Elena Gramatová	[98]
55	Nicolas Guibert	[53] [66] [75]
56	Loïs Guiller	[20] [21] [22] [25] [26] [28] [31] [33] [35] [40] [51] [56] [63] [64] [80]
57	Laurent Guittet	[36] [61] [66] [75] [84] [90] [102] [106] [117] [121] [145] [148]
58	Olivier Héron	[52] [60] [62] [71] [79]
59	Isabelle Izaute	[119] [124]
60	Francis Jambon	[15] [16] [23] [39] [61] [128]
61	Seiji Kajihara	[91] [129] [146] [155]
62	Michael A. Kochte	[146]
63	Christophe Kolski	[122]
64	Andrzej Krasniewski	[98]
65	Thomas Lachaume	[148]
66	Christian Landrault	[1] [2] [3] [4] [5] [6] [7] [9] [10] [11] [12] [13] [14] [17] [18] [19] [20] [21] [22] [25] [26] [27] [28] [30] [31] [32] [33] [34] [35] [40] [41] [42] [44] [46] [47] [49] [51] [56] [63] [64] [73] [74] [80] [82] [83] [88] [89] [92] [93] [94] [95] [96] [97] [99] [104] [105] [108] [109] [114] [115]
67	Eric Lecolinet	[48]
68	Jeremy Lee	[144]
69	Fenrong Liu	[149]
70	M. Lopez	[26]
71	Junxia Ma	[140] [144] [161]
72	Ken Mackay	[162]
73	Salvador Manich	[21] [26]
74	Adrien Marion	[131]
75	Pierre-Didier Mauroux	[118] [135] [152] [160]
76	Kohei Miyase	[91] [129] [134] [146] [155] [156]
77	V. Moreda	[12] [17] [19]
78	Alexandre Ney	[89] [93] [97] [101] [103] [112] [116] [125]
79	Nicola Nicolici	[100] [111]
80	Yuji Ohsumi	[91]
81	Guillaume Patry	[24] [37]
82	Adam Pawlak	[98]
83	Guy Pierra	[8]
84	Jean-Claude Potier	[8]
85	Serge Pravossoudovitch	[1] [2] [3] [4] [5] [6] [7] [9] [10] [11] [12] [14] [17] [19] [20] [21] [22] [25] [26] [28] [30] [31] [32] [33] [34] [35] [40] [41] [42] [44] [46] [47] [51] [52] [55] [56] [57] [60] [62] [63] [64] [65] [69] [70] [71] [72] [73] [74] [76] [78] [79] [80] [82] [83] [85] [87] [88] [89] [92] [93] [94] [95] [96] [97] [99] [101] [103] [104] [105] [108] [109] [110] [112] [114] [115] [116] [118] [119] [123] [124] [125] [126] [127] [130] [132] [134] [135] [136] [137] [138] [139] [140] [141] [142] [143] [147] [150] [151] [152] [153] [154] [157] [158] [160]
86	G. Prenat	[162]
87	Alexandre Rail	[81]
88	Paolo Rech	[133] [143]
89	Michel Renovell	[52] [60] [62] [71] [79]
90	Matteo Sonza Reorda	[123] [139] [151]
91	Olivia Riewer	[126] [142]
92	B. Rodriguez	[6] [7] [10]
93	Paul M. Rosinger	[77] [86]
94	Alexandre Rousset	[95] [96] [109]
95	Kaushik Roy	[111]
96	Olivier Roy	[113]
97	Hassan Salmani	[159]
98	Loé Sanou	[84] [102] [106] [117]
99	Marcelino B. Santos (Marcelino Bicho Dos Santos)	[21] [26]
100	Dominique L. Scapin	[48] [90] [102] [117] [121] [128]
101	Jeremy Seligman	[120] [149]
102	D. Severac	[11] [14]
103	Tatsuya Suzuki	[91]
104	Mohammad Tehranipoor	[127] [129] [134] [140] [144] [146] [159] [161]
105	Paulo J. Teixeira	[21] [26]
106	Guillaume Texier	[36]
107	Vincent Thomson	[58] [81] [107]
108	Aida Todri (Aida Todri-Sanial)	[154] [156] [157] [162]
109	Chi Dung Tran	[122]
110	D. A. Tran	[132] [158]
111	Y. Uchinodan	[155]
112	Laurent Vachez	[135] [152] [160]
113	Miroslav Valka	[150]
114	Julien Vial	[104] [105] [108] [115]
115	Arnaud Virazel	[17] [19] [30] [32] [34] [41] [42] [44] [55] [57] [63] [64] [65] [69] [70] [72] [73] [74] [76] [78] [80] [82] [83] [85] [87] [88] [89] [92] [93] [94] [95] [96] [97] [99] [101] [103] [104] [105] [108] [109] [112] [114] [115] [116] [118] [119] [124] [125] [126] [127] [130] [132] [134] [135] [136] [137] [138] [140] [141] [142] [143] [147] [150] [152] [153] [154] [155] [156] [157] [158] [160] [162]
116	Didier Vray	[131]
117	Laung-Terng Wang	[91] [129]
118	Zhanglei Wang	[99]
119	X. Wen	[156]
120	Xiaoqing Wen	[91] [111] [127] [129] [134] [140] [146] [155] [159]
121	Fangmei Wu	[127] [134] [140] [155]
122	Hans-Joachim Wunderlich	[33] [42] [83] [132] [158]
123	Yuta Yamato	[91] [129] [146] [155]
124	Wei Zhao	[140] [159]
125	Leonardo Bonet Zordan	[153] [157]

Colors in the list of coauthors

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