 | 2011 |
|---|
| 10 |       | Ch. Muller,
Damien Deleruyelle,
Olivier Ginez,
Jean Michel Portal,
Marc Bocquet:
Design challenges for prototypical and emerging memory concepts relying on resistance switching.
CICC 2011: 1-7 |
| 2009 |
|---|
| 9 | | Olivier Ginez,
Jean Michel Portal,
Hassen Aziza:
An on-line testing scheme for repairing purposes in Flash memories.
DDECS 2009: 120-123 |
| 8 | | Olivier Ginez,
Jean Michel Portal,
Ch. Muller:
Design and Test Challenges in Resistive Switching RAM (ReRAM): An Electrical Model for Defect Injections.
European Test Symposium 2009: 61-66 |
| 7 | | Olivier Ginez,
Jean Michel Daga,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel:
A SPICE-Like 2T-FLOTOX Core-Cell Model for Defect Injection and Faulty Behavior Prediction in eFlash.
J. Electronic Testing 25(2-3): 127-144 (2009) |
| 2008 |
|---|
| 6 | | Olivier Ginez,
Jean Michel Portal,
Hassen Aziza:
A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories.
ITC 2008: 1-10 |
| 5 | | Hassen Aziza,
Emmanuel Bergeret,
Jean Michel Portal,
Olivier Ginez:
A Novel Low Power Oriented Design Methodology for Analog Blocks.
J. Low Power Electronics 4(1): 60-67 (2008) |
| 2007 |
|---|
| 4 | | Olivier Ginez,
Jean Michel Daga,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel:
Electrical Simulation Model of the 2T-FLOTOX Core-Cell for Defect Injection and Faulty Behavior Prediction in eFlash Memories.
European Test Symposium 2007: 77-84 |
| 3 | | Olivier Ginez,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel,
Jean Michel Daga:
A concurrent approach for testing address decoder faults in eFlash memories.
ITC 2007: 1-10 |
| 2 | | Olivier Ginez,
Jean Michel Daga,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel:
Retention and Reliability Problems in Embedded Flash Memories: Analysis and Test of Defective 2T-FLOTOX Tunnel Window.
VTS 2007: 47-52 |
| 2006 |
|---|
| 1 | | Olivier Ginez,
Jean Michel Daga,
Marylene Combe,
Patrick Girard,
Christian Landrault,
Serge Pravossoudovitch,
Arnaud Virazel:
An Overview of Failure Mechanisms in Embedded Flash Memories.
VTS 2006: 108-113 |
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