C. Giannakopoulos

	2001
1		M. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, Jalal Jomaah, G. Ghibaudo: Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics. Microelectronics Reliability 41(9-10): 1361-1366 (2001)

Coauthor Index

1	B. Cretu	[1]
2	T. Devoivre	[1]
3	M. Fadlallah	[1]
4	Gérard Ghibaudo (G. Ghibaudo)	[1]
5	Jalal Jomaah	[1]
6	F. Monsieur	[1]
7	A. Szewczyk	[1]

Last update Tue May 29 20:41:18 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page