Ashish Giani

	2002
4		Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: State and Fault Information for Compaction-Based Test Generation. J. Electronic Testing 18(1): 63-72 (2002)
	2001
3		Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: Efficient spectral techniques for sequential ATPG. DATE 2001: 204-208
2		Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: Novel Spectral Methods for Built-In Self-Test in a System-on-a-Chip Environment. VTS 2001: 163-168
	2000
1		Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwani D. Agrawal: Compaction-based test generation using state and fault information. Asian Test Symposium 2000: 159-164

Coauthor Index

1	Vishwani D. Agrawal	[1] [2] [3] [4]
2	Michael S. Hsiao	[1] [2] [3] [4]
3	Shuo Sheng	[1] [2] [3] [4]

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