A. Ghetti

	2007
6		R. Bottini, S. Costantini, N. Galbiati, A. Ghetti, G. Ghidini, A. Mauri, C. Scozzari, A. Sebastiani: High voltage transistor degradation in NVM pump application. Microelectronics Reliability 47(9-11): 1384-1388 (2007)
	2005
5		G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia: Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability 45(5-6): 857-860 (2005)
	2003
4		G. Ghidini, A. Garavaglia, G. Giusto, A. Ghetti, R. Bottini, D. Peschiaroli, M. Scaravaggi, F. Cazzaniga, D. Ielmini: Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET. Microelectronics Reliability 43(8): 1221-1227 (2003)
3		A. Ghetti, D. Brazzelli, A. Benvenuti, G. Ghidini, A. Pavan: Anomalous gate oxide conduction on isolation edges: analysis and process optimization. Microelectronics Reliability 43(8): 1229-1235 (2003)
	2002
2		E. Viganò, A. Ghetti, G. Ghidini, A. S. Spinelli: Post-breakdown characterization in thin gate oxides. Microelectronics Reliability 42(9-11): 1491-1496 (2002)
	2001
1		A. Ghetti, M. Alam, J. Bude: Anode hole generation mechanisms. Microelectronics Reliability 41(9-10): 1347-1354 (2001)

Coauthor Index

1	M. Alam	[1]
2	A. Benvenuti	[3]
3	R. Bottini	[4] [5] [6]
4	D. Brazzelli	[3] [5]
5	J. Bude	[1]
6	F. Cazzaniga	[4]
7	S. Costantini	[6]
8	N. Galbiati	[5] [6]
9	A. Garavaglia	[4] [5]
10	G. Ghidini	[2] [3] [4] [5] [6]
11	G. Giusto	[4] [5]
12	D. Ielmini	[4]
13	M. Langenbuch	[5]
14	A. Mauri	[6]
15	A. Pavan	[3]
16	D. Peschiaroli	[4]
17	M. Scaravaggi	[4]
18	C. Scozzari	[6]
19	A. Sebastiani	[6]
20	A. S. Spinelli	[2]
21	E. Viganò	[2]

Colors in the list of coauthors

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