 | 2011 |
|---|
| 10 |       | Valentin Gherman,
J. Massas,
Samuel Evain,
Stéphane Chevobbe,
Yannick Bonhomme:
Error prediction based on concurrent self-test and reduced slack time.
DATE 2011: 1626-1631 |
| 9 | | Valentin Gherman,
Samuel Evain,
Nathaniel Seymour,
Yannick Bonhomme:
Generalized parity-check matrices for SEC-DED codes with fixed parity.
IOLTS 2011: 198-201 |
| 8 | | Valentin Gherman,
Samuel Evain,
Fabrice Auzanneau,
Yannick Bonhomme:
Programmable extended SEC-DED codes for memory errors.
VTS 2011: 140-145 |
| 2010 |
|---|
| 7 | | Samuel Evain,
Yannick Bonhomme,
Valentin Gherman:
Programmable restricted SEC codes to mask permanent faults in semiconductor memories.
IOLTS 2010: 147-153 |
| 2009 |
|---|
| 6 | | Valentin Gherman,
Samuel Evain,
Mickael Cartron,
Nathaniel Seymour,
Yannick Bonhomme:
System-level hardware-based protection of memories against soft-errors.
DATE 2009: 1222-1225 |
| 2007 |
|---|
| 5 | | Valentin Gherman,
Hans-Joachim Wunderlich,
R. D. Mascarenhas,
Jürgen Schlöffel,
Michael Garbers:
Synthesis of irregular combinational functions with large don't care sets.
ACM Great Lakes Symposium on VLSI 2007: 287-292 |
| 4 | | Valentin Gherman,
Hans-Joachim Wunderlich,
Jürgen Schlöffel,
Michael Garbers:
Deterministic logic BIST for transition fault testing.
IET Computers & Digital Techniques 1(3): 180-186 (2007) |
| 2006 |
|---|
| 3 | | Valentin Gherman,
Hans-Joachim Wunderlich,
Jürgen Schlöffel,
Michael Garbers:
Deterministic Logic BIST for Transition Fault Testing.
European Test Symposium 2006: 123-130 |
| 2005 |
|---|
| 2 | | Abdul Wahid Hakmi,
Hans-Joachim Wunderlich,
Valentin Gherman,
Michael Garbers,
Jürgen Schlöffel:
Implementing a Scheme for External Deterministic Self-Test.
VTS 2005: 101-106 |
| 2004 |
|---|
| 1 | | Valentin Gherman,
Hans-Joachim Wunderlich,
Harald P. E. Vranken,
Friedrich Hapke,
Michael Wittke,
Michael Garbers:
Efficient Pattern Mapping for Deterministic Logic BIST.
ITC 2004: 48-56 |
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