 | 2011 |
|---|
| 5 |       | Rani S. Ghaida,
Kanak B. Agarwal,
Sani R. Nassif,
Xin Yuan,
Lars Liebmann,
Puneet Gupta:
A framework for double patterning-enabled design.
ICCAD 2011: 14-20 |
| 2010 |
|---|
| 4 | | Tuck-Boon Chan,
Rani S. Ghaida,
Puneet Gupta:
Electrical Modeling of Lithographic Imperfections.
VLSI Design 2010: 423-428 |
| 2009 |
|---|
| 3 | | Rani S. Ghaida,
Puneet Gupta:
A framework for early and systematic evaluation of design rules.
ICCAD 2009: 615-622 |
| 2 | | Rani S. Ghaida,
Payman Zarkesh-Ha:
A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects.
J. Electronic Testing 25(1): 67-77 (2009) |
| 2007 |
|---|
| 1 | | Rani S. Ghaida,
Payman Zarkesh-Ha:
Estimation of Electromigration-Aggravating Narrow Interconnects Using a Layout Sensitivity Model.
DFT 2007: 59-67 |
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