Simone Gerardin

	2012
11		M. Bagatin, Simone Gerardin, Alessandro Paccagnella, C. Andreani, G. Gorini, C. D. Frost: Temperature dependence of neutron-induced soft errors in SRAMs. Microelectronics Reliability 52(1): 289-293 (2012)
	2010
10		M. Bagatin, Simone Gerardin, Alessandro Paccagnella, G. Cellere, F. Irom, D. N. Nguyen: Destructive events in NAND Flash memories irradiated with heavy ions. Microelectronics Reliability 50(9-11): 1832-1836 (2010)
9		Simone Gerardin, M. Bagatin, Alessandro Paccagnella, G. Cellere, A. Visconti, M. Bonanomi: Impact of total dose on heavy-ion upsets in floating gate arrays. Microelectronics Reliability 50(9-11): 1837-1841 (2010)
	2009
8		Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda, Davide Appello: Evaluating Alpha-induced soft errors in embedded microprocessors. IOLTS 2009: 69-74
7		Davide Appello, Paolo Bernardi, Simone Gerardin, Michelangelo Grosso, Alessandro Paccagnella, Paolo Rech, Matteo Sonza Reorda: DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study. VTS 2009: 276-281
	2008
6		Niccolò Battezzati, Simone Gerardin, Andrea Manuzzato, Alessandro Paccagnella, Sana Rezgui, Luca Sterpone, Massimo Violante: On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs. IOLTS 2008: 135-140
	2007
5		Andrea Manuzzato, Paolo Rech, Simone Gerardin, Alessandro Paccagnella, Luca Sterpone, Massimo Violante: Sensitivity Evaluation of TMR-Hardened Circuits to Multiple SEUs Induced by Alpha Particles in Commercial SRAM-Based FPGAs. DFT 2007: 79-86
4		M. Bagatin, G. Cellere, Simone Gerardin, Alessandro Paccagnella, A. Visconti, S. Beltrami, M. Maccarrone: Single Event Effects in 1Gbit 90nm NAND Flash Memories under Operating Conditions. IOLTS 2007: 146-151
3		J. Martín-Martínez, Simone Gerardin, R. Rodríguez, M. Nafría, X. Aymerich, A. Cester, Alessandro Paccagnella, G. Ghidini: Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs. Microelectronics Reliability 47(9-11): 1349-1352 (2007)
	2006
2		Simone Gerardin, A. Griffoni, A. Cester, Alessandro Paccagnella, G. Ghidini: Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectronics Reliability 46(9-11): 1669-1672 (2006)
1		Francesca Danesin, Franco Zanon, Simone Gerardin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella: Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. Microelectronics Reliability 46(9-11): 1750-1753 (2006)

Coauthor Index

1	C. Andreani	[11]
2	Davide Appello	[7] [8]
3	X. Aymerich	[3]
4	M. Bagatin	[4] [9] [10] [11]
5	Niccolò Battezzati	[6]
6	S. Beltrami	[4]
7	Paolo Bernardi	[7] [8]
8	M. Bonanomi	[9]
9	G. Cellere	[4] [9] [10]
10	A. Cester	[2] [3]
11	Francesca Danesin	[1]
12	C. D. Frost	[11]
13	G. Ghidini	[2] [3]
14	G. Gorini	[11]
15	A. Griffoni	[2]
16	Michelangelo Grosso	[7] [8]
17	F. Irom	[10]
18	M. Maccarrone	[4]
19	Andrea Manuzzato	[5] [6]
20	J. Martín-Martínez	[3]
21	Gaudenzio Meneghesso	[1]
22	M. Nafría	[3]
23	D. N. Nguyen	[10]
24	Alessandro Paccagnella	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11]
25	F. Rampazzo	[1]
26	Paolo Rech	[5] [7] [8]
27	Matteo Sonza Reorda	[7] [8]
28	Sana Rezgui	[6]
29	R. Rodríguez	[3]
30	Luca Sterpone	[5] [6]
31	Massimo Violante	[5] [6]
32	A. Visconti	[4] [9]
33	Franco Zanon	[1]
34	Enrico Zanoni	[1]

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page