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Stefan De Gendt Coauthor index pubzone.org

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DBLP keys2007
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLZ. Li, T. Schram, L. Pantisano, A. Stesmans, Thierry Conard, S. Shamuilia, V. V. Afanasiev, A. Akheyar, Sven Van Elshocht, D. P. Brunco, W. Deweerd, Y. Naoki, P. Lehnen, Stefan De Gendt, K. De Meyer: Mechanism of O2-anneal induced Vfb shifts of Ru gated stacks. Microelectronics Reliability 47(4-5): 518-520 (2007)
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLM. Houssa, M. Aoulaiche, Stefan De Gendt, Guido Groeseneken, Marc M. Heyns: Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling. Microelectronics Reliability 47(6): 880-889 (2007)
2005
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLG. S. Lujan, W. Magnus, L.-Å. Ragnarsson, S. Kubicek, Stefan De Gendt, Marc M. Heyns, K. De Meyer: Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance. Microelectronics Reliability 45(5-6): 794-797 (2005)
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVidya Kaushik, Martine Claes, Annelies Delabie, Sven Van Elshocht, Olivier Richard, Thierry Conard, Erika Rohr, Thomas Witters, Matty Caymax, Stefan De Gendt: Observation and characterization of defects in HfO2 high-K gate dielectric layers. Microelectronics Reliability 45(5-6): 798-801 (2005)
2001
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLC. Zhao, G. Roebben, H. Bender, E. Young, S. Haukka, M. Houssa, M. Naili, Stefan De Gendt, Marc M. Heyns, Omer Van der Biest: In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction. Microelectronics Reliability 41(7): 995-998 (2001)
1999
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMarc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke: Cost-effective cleaning and high-quality thin gate oxides. IBM Journal of Research and Development 43(3): 339-350 (1999)

Coauthor Index

1V. V. Afanasiev [6]
2A. Akheyar [6]
3M. Aoulaiche [5]
4Twan Bearda [1]
5H. Bender [2]
6Omer Van der Biest [2]
7D. P. Brunco [6]
8Matty Caymax [3]
9Martine Claes [3]
10Thierry Conard [3] [6]
11Ingrid Cornelissen [1]
12Robin Degraeve [1]
13Annelies Delabie [3]
14W. Deweerd [6]
15Sven Van Elshocht [3] [6]
16Guido Groeseneken [1] [5]
17S. Haukka [2]
18Marc M. Heyns [1] [2] [4] [5]
19M. Houssa [2] [5]
20Vidya Kaushik [3]
21Conny Kenens [1]
22D. Martin Knotter [1]
23S. Kubicek [4]
24P. Lehnen [6]
25Z. Li [6]
26Lee M. Loewenstein [1]
27G. S. Lujan [4]
28W. Magnus [4]
29Paul W. Mertens [1]
30Sofie Mertens [1]
31Marc Meuris [1]
32K. De Meyer [4] [6]
33M. Naili [2]
34Y. Naoki [6]
35Tanya Nigam [1]
36L. Pantisano [6]
37L.-Å. Ragnarsson [4]
38Olivier Richard [3]
39G. Roebben [2]
40Erika Rohr [3]
41Marc Schaekers [1]
42T. Schram [6]
43S. Shamuilia [6]
44A. Stesmans [6]
45Ivo Teerlinck [1]
46Wilfried Vandervorst [1]
47Rita Vos [1]
48Thomas Witters [3]
49Klaus Wolke [1]
50E. Young [2]
51C. Zhao [2]

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