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| 2011 | ||
|---|---|---|
| 88 | Chen Zhao, Jun He, Sheng-Huang Lee, Karl Peterson, Randall L. Geiger, Degang Chen: Linear vt-based temperature sensors with low process sensitivity and improved power supply headroom. ISCAS 2011: 2553-2556 | |
| 2010 | ||
| 87 | Jingbo Duan, Degang Chen, Randall L. Geiger: Phase control of triangular stimulus generator for ADC BIST. ISCAS 2010: 1935-1938 | |
| 86 | Jun He, Degang Chen, Randall L. Geiger: Detailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators. ISCAS 2010: 2390-2393 | |
| 85 | Bharath K. Vasan, Randall L. Geiger, Degang Chen: Linearity testing of ADCs using low linearity stimulus and Kalman filtering. ISCAS 2010: 3032-3035 | |
| 2009 | ||
| 84 | Jingbo Duan, Degang Chen, Randall L. Geiger: Cost Effective Signal Generators for ADC BIST. ISCAS 2009: 13-16 | |
| 83 | Thu T. Duong, Degang Chen, Randall L. Geiger: Optimal Area and Impedance Allocation for Dual-string DACs. ISCAS 2009: 2741-2744 | |
| 82 | Le Jin, Degang Chen, Randall L. Geiger: Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE T. Instrumentation and Measurement 58(8): 2679-2685 (2009) | |
| 81 | Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger: High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy. IEEE T. Instrumentation and Measurement 58(8): 2697-2705 (2009) | |
| 80 | Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger: Analyses of Static and Dynamic Random Offset Voltages in Dynamic Comparators. IEEE Trans. on Circuits and Systems 56-I(5): 911-919 (2009) | |
| 2008 | ||
| 79 | Hanqing Xing, Degang Chen, Randall L. Geiger: On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering. EIT 2008: 117-122 | |
| 78 | Jacob D. Sloat, Randall L. Geiger: An inexpensive microelectronic environmental test chamber. EIT 2008: 168-170 | |
| 77 | Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger: A simple and accurate method to predict offset voltage in dynamic comparators. ISCAS 2008: 1934-1937 | |
| 76 | Vipul Katyal, Randall L. Geiger, Degang Chen: Adjustable hysteresis CMOS Schmitt triggers. ISCAS 2008: 1938-1941 | |
| 75 | Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin: System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS 2008: 2402-2405 | |
| 74 | Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen: Testing of Precision DAC Using Low-Resolution ADC With Wobbling. IEEE T. Instrumentation and Measurement 57(5): 940-946 (2008) | |
| 2007 | ||
| 73 | Haibo Fei, Randall L. Geiger: Linear Current Division Principles. ISCAS 2007: 2830-2833 | |
| 72 | Hanjun Jiang, Degang Chen, Randall L. Geiger: Deterministic DEM DAC Performance Analysis. ISCAS 2007: 3860-3863 | |
| 71 | Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger: A fully digital-compatible BIST strategy for ADC linearity testing. ITC 2007: 1-10 | |
| 70 | Le Jin, Degang Chen, Randall L. Geiger: Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS 2007: 303-310 | |
| 69 | Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger: Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. IEEE T. Instrumentation and Measurement 56(5): 1753-1762 (2007) | |
| 68 | Le Jin, Degang Chen, Randall L. Geiger: SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. IEEE T. Instrumentation and Measurement 56(5): 1776-1785 (2007) | |
| 2006 | ||
| 67 | Vipul Katyal, Randall L. Geiger, Degang Chen: A New High Precision Low Offset Dynamic Comparator for High Resolution High Speed ADCs. APCCAS 2006: 5-8 | |
| 66 | Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger: A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS 2006 | |
| 65 | Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger: Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS 2006 | |
| 64 | Chao Su, Randall L. Geiger: Dynamic calibration of current-steering DAC. ISCAS 2006 | |
| 63 | Xin Dai, Degang Chen, Randall L. Geiger: Explicit characterization of bandgap references. ISCAS 2006 | |
| 62 | Hanqing Xing, Degang Chen, Randall L. Geiger: Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs. ISCAS 2006 | |
| 61 | K. Wada, Randall L. Geiger: Minimization of total area in integrated active RC filters. ISCAS 2006 | |
| 60 | Yu Lin, Randall L. Geiger: Unit resistor characterization for matching-critical circuit design. ISCAS 2006 | |
| 59 | Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen: Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC 2006: 1-10 | |
| 58 | Le Jin, Degang Chen, Randall L. Geiger: Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. ITC 2006: 1-9 | |
| 57 | Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger: A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations. IEEE T. Instrumentation and Measurement 55(3): 902-915 (2006) | |
| 2005 | ||
| 56 | Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger: A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test. ISCAS (1) 2005: 784-787 | |
| 55 | Zhongjun Yu, Degang Chen, Randall L. Geiger, Ioannis Papantonopoulos: Pipeline ADC linearity testing with dramatically reduced data capture time. ISCAS (1) 2005: 792-795 | |
| 54 | Le Jin, Degang Chen, Randall L. Geiger: A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) 2005: 1378-1381 | |
| 53 | Yu Lin, Vipul Katyal, Randall L. Geiger: Power dependence of feedback amplifiers on opamp architecture. ISCAS (2) 2005: 1618-1621 | |
| 52 | Yu Lin, Vipul Katyal, Mark Schlarmann, Randall L. Geiger: kT/C constrained optimization of power in pipeline ADCs. ISCAS (3) 2005: 1968-1971 | |
| 51 | Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen: A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) 2005: 3809-3812 | |
| 50 | Hanjun Jiang, Degang Chen, Randall L. Geiger: Dither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACs. ISCAS (5) 2005: 4285-4288 | |
| 49 | Hanqing Xing, Degang Chen, Randall L. Geiger: A two-step DDEM ADC for accurate and cost-effective DAC testing. ISCAS (5) 2005: 4289-4292 | |
| 48 | Xin Dai, Degang Chen, Randall L. Geiger: A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs. ISCAS (5) 2005: 4831-4834 | |
| 47 | Xin Dai, Chengming He, Hanqing Xing, Degang Chen, Randall L. Geiger: An N/sup th/ order central symmetrical layout pattern for nonlinear gradients cancellation. ISCAS (5) 2005: 4835-4838 | |
| 46 | Sreenath Thoka, Randall L. Geiger: Fast-switching adaptive bandwidth frequency synthesizer using a loop filter with switched zero-resistor array. ISCAS (6) 2005: 5373-5376 | |
| 45 | Degang Chen, Zhongjun Yu, Randall L. Geiger: An adaptive, truly background calibration method for high speed pipeline ADC design. ISCAS (6) 2005: 6190-6193 | |
| 44 | Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger: A 16-bit resistor string DAC with full-calibration at final test. ITC 2005: 10 | |
| 43 | Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen: High-performance ADC linearity test using low-precision signals in non-stationary environments. ITC 2005: 10 | |
| 42 | Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger: Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE T. Instrumentation and Measurement 54(3): 1188-1199 (2005) | |
| 2004 | ||
| 41 | Chengming He, Kuangming Yap, Degang Chen, Randall L. Geiger: NTH order circular symmetry pattern and hexagonal tesselation: two new layout techniques cancelling nonlinear gradient. ISCAS (1) 2004: 237-240 | |
| 40 | Zhongjun Yu, Degang Chen, Randall L. Geiger: The SRE/SRM approach for spectral testing of AMS circuits. ISCAS (1) 2004: 249-252 | |
| 39 | Chengming He, Le Jin, Degang Chen, Randall L. Geiger: Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) 2004: 481-484 | |
| 38 | Hanjun Jiang, Haibo Fei, Degang Chen, Randall L. Geiger: A background digital self-calibration scheme for pipelined ADCs based on transfer curve estimation. ISCAS (1) 2004: 61-64 | |
| 37 | Zhongjun Yu, Degang Chen, Randall L. Geiger: Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations. ISCAS (1) 2004: 645-648 | |
| 36 | Haibo Fei, Randall L. Geiger, Degang Chen: Optimum area allocation for resistors and capacitors in continuous-time monolithic filters. ISCAS (1) 2004: 865-868 | |
| 35 | Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger: Testing high resolution ADCs using deterministic dynamic element matching. ISCAS (1) 2004: 920-923 | |
| 34 | Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger: Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing. ISCAS (1) 2004: 924-927 | |
| 33 | Le Jin, Chengming He, Degang Chen, Randall L. Geiger: An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) 2004: 928-931 | |
| 32 | Le Jin, Chengming He, Degang Chen, Randall L. Geiger: Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) 2004: 932-935 | |
| 31 | Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger: Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs. ITC 2004: 1379-1388 | |
| 30 | Zhongjun Yu, Degang Chen, Randall L. Geiger: A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling. ITC 2004: 1398-1407 | |
| 2003 | ||
| 29 | Chengming He, Degang Chen, Randall L. Geiger: A low-voltage compatible two-stage amplifier with /spl ges/120 dB gain in standard digital CMOS. ISCAS (1) 2003: 353-356 | |
| 28 | Kee-Chee Tiew, J. Cusey, Randall L. Geiger: Inflection point correction for voltage references. ISCAS (1) 2003: 649-652 | |
| 27 | Chao Su, Sreenath Thoka, Kee-Chee Tiew, Randall L. Geiger: A 40 GHz modified-Colpitts voltage controlled oscillator with increased tuning range. ISCAS (1) 2003: 717-720 | |
| 26 | Zhongjun Yu, Degang Chen, Randall L. Geiger: 1-D and 2-D switching strategies achieving near optimal INL for thermometer-coded current steering DACs. ISCAS (1) 2003: 909-912 | |
| 25 | Beatriz Olleta, Lance Juffer, Degang Chen, Randall L. Geiger: A deterministic dynamic element matching approach to ADC testing. ISCAS (5) 2003: 533-536 | |
| 24 | Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger: Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. ISCAS (5) 2003: 537-540 | |
| 23 | Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger: Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. ITC 2003: 218-227 | |
| 22 | Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger: BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003) | |
| 2002 | ||
| 21 | M. M. Amourah, Randall L. Geiger: All digital transistor high gain operational amplifier using positive feedback technique. ISCAS (1) 2002: 701-704 | |
| 20 | Yonghua Cong, Randall L. Geiger: Formulation of INL and DNL yield estimation in current-steering D/A converters. ISCAS (3) 2002: 149-152 | |
| 19 | Yonghui Tang, Randall L. Geiger: Transient bit error rate analysis of data recovery systems using jitter models. ISCAS (3) 2002: 185-188 | |
| 18 | Kee-Chee Tiew, J. Cusey, Randall L. Geiger: A curvature compensation technique for bandgap voltage references using adaptive reference temperature. ISCAS (4) 2002: 265-268 | |
| 17 | Yu Lin, Randall L. Geiger: Resistors layout for enhancing yield of R-2R DACs. ISCAS (5) 2002: 97-100 | |
| 2001 | ||
| 16 | Jie Yan, Randall L. Geiger: Fast-settling CMOS operational amplifiers with negative conductance voltage gain enhancement. ISCAS (1) 2001: 228-231 | |
| 15 | M. M. Amourah, Randall L. Geiger: Gain and bandwidth boosting techniques for high-speed operational amplifiers. ISCAS (1) 2001: 232-235 | |
| 14 | Yonghui Tang, Randall L. Geiger: A 2.5 Gbit/s CMOS PLL for data/clock recovery without frequency divider. ISCAS (1) 2001: 256-259 | |
| 13 | Huiting Chen, F. Whiteside, Randall L. Geiger: Current mirror circuit with accurate mirror gain for low beta transistors. ISCAS (1) 2001: 536-539 | |
| 12 | M. M. Amourah, Randall L. Geiger: A high gain strategy with positive-feedback gain enhancement technique. ISCAS (1) 2001: 631-634 | |
| 11 | Mao-Feng Lan, Randall L. Geiger: Modeling of random channel parameter variations in MOS transistors. ISCAS (1) 2001: 85-88 | |
| 10 | Mao-Feng Lan, Randall L. Geiger: MOSGRAD-a tool for simulating the effects of systematic and random channel parameter variations. ISCAS (1) 2001: 89-92 | |
| 9 | Mark Schlarmann, Randall L. Geiger: Prototype implementation of a WWW based analog circuit design tool. ISCAS (1) 2001: 97-100 | |
| 1999 | ||
| 8 | L. Wu, H. Chen, S. Nagavarapu, Randall L. Geiger, E. Lee, W. Black: A monolithic 1.25 Gbits/sec CMOS clock/data recovery circuit for fibre channel transceiver. ISCAS (2) 1999: 565-568 | |
| 7 | H. Chen, E. Lee, Randall L. Geiger: A 2 GHz VCO with process and temperature compensation. ISCAS (2) 1999: 569-572 | |
| 6 | M. E. Schlarmann, E. K. F. Lee, Randall L. Geiger: A new multipath amplifier design technique for enhancing gain without sacrificing bandwidth. ISCAS (2) 1999: 610-615 | |
| 5 | S. Nagavarapu, J. Yan, E. K. F. Lee, Randall L. Geiger: An asynchronous data recovery/retransmission technique with foreground DLL calibration. ISCAS (6) 1999: 354-357 | |
| 1994 | ||
| 4 | Chong-Gun Yu, Randall L. Geiger: An Accurate and Matching-Free Threshold Voltage Extraction Scheme for MOS Transistors. ISCAS 1994: 115-118 | |
| 3 | Joon-Yub Kim, Randall L. Geiger: MOS Active Attenuators for Analog ICs and their Applications to FInite Gain Amplifiers. ISCAS 1994: 701-704 | |
| 1993 | ||
| 2 | Chong-Gun Yu, Randall L. Geiger: Very Low Voltage Operational Amplifiers Using Floating Gate MOS Transistor. ISCAS 1993: 1152-1155 | |
| 1 | George R. Spalding, Randall L. Geiger: Digital correction for improved spectral response in signal generation systems. ISCAS 1993: 132-135 | |
Colors in the list of coauthors
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