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| 2001 | ||
|---|---|---|
| 1 | F. G. M. de Jong, Alex S. Biewenga, D. C. L. van Geest, T. F. Waayers: Testing and programming flash memories on assemblies during high volume production. ITC 2001: 470-479 | |
| 1 | Alex S. Biewenga | [1] |
| 2 | Frans de Jong (F. G. M. de Jong) | [1] |
| 3 | T. F. Waayers | [1] |
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