J.-L. Gauffier

	2006
2		C. De Nardi, Romain Desplats, Philippe Perdu, J.-L. Gauffier, C. Guérin: Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards. Microelectronics Reliability 46(9-11): 1569-1574 (2006)
	2005
1		C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier: Oxide charge measurements in EEPROM devices. Microelectronics Reliability 45(9-11): 1514-1519 (2005)

Coauthor Index

1	Felix Beaudoin	[1]
2	Romain Desplats	[1] [2]
3	C. Guérin	[2]
4	C. De Nardi	[1] [2]
5	Philippe Perdu	[1] [2]

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