A. Gattiker

	2005
1		Stas Polonsky, M. Bhushan, A. Gattiker, Alan J. Weger, Peilin Song: Photon emission microscopy of inter/intra chip device performance variations. Microelectronics Reliability 45(9-11): 1471-1475 (2005)

Coauthor Index

1	M. Bhushan	[1]
2	Stas Polonsky	[1]
3	Peilin Song	[1]
4	Alan J. Weger	[1]

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page