X. Garros

	2009
3		X. Garros, M. Casse, M. Rafik, Claire Fenouillet-Béranger, Gilles Reimbold, F. Martin, C. Wiemer, F. Boulanger: Process dependence of BTI reliability in advanced HK MG stacks. Microelectronics Reliability 49(9-11): 982-988 (2009)
	2007
2		Gilles Reimbold, J. Mitard, X. Garros, Charles Leroux, G. Ghibaudo, F. Martin: Initial and PBTI-induced traps and charges in Hf-based oxides/TiN stacks. Microelectronics Reliability 47(4-5): 489-496 (2007)
	2001
1		N. Revil, X. Garros: Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications. Microelectronics Reliability 41(9-10): 1307-1312 (2001)

Coauthor Index

1	F. Boulanger	[3]
2	M. Casse	[3]
3	Claire Fenouillet-Béranger	[3]
4	Gérard Ghibaudo (G. Ghibaudo)	[2]
5	Charles Leroux	[2]
6	F. Martin	[2] [3]
7	J. Mitard	[2]
8	M. Rafik	[3]
9	Gilles Reimbold	[2] [3]
10	N. Revil	[1]
11	C. Wiemer	[3]

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page