B. Garrido

	2008
3		A. Cuadras, B. Garrido, J. R. Morante, L. Fonseca: Leakage currents and dielectric breakdown of Si1-x-yGexCy thermal oxides. Microelectronics Reliability 48(10): 1635-1640 (2008)
	2005
2		Josep Carreras, B. Garrido, J. R. Morante: Improved charge injection in Si nanocrystal non-volatile memories. Microelectronics Reliability 45(5-6): 899-902 (2005)
1		V. I. Turchanikov, A. N. Nazarov, V. S. Lysenko, Josep Carreras, B. Garrido: Charge storage peculiarities in poly-Si-SiO2-Si memory devices with Si nanocrystals rich SiO2. Microelectronics Reliability 45(5-6): 903-906 (2005)

Coauthor Index

1	Josep Carreras	[1] [2]
2	A. Cuadras	[3]
3	L. Fonseca	[3]
4	V. S. Lysenko	[1]
5	J. R. Morante	[2] [3]
6	A. N. Nazarov	[1]
7	V. I. Turchanikov	[1]

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