C. M. Garner

	2005
1		C. M. Garner, G. Kloster, G. Atwood, L. Mosley, A. C. Palanduz: Challenges for dielectric materials in future integrated circuit technologies. Microelectronics Reliability 45(5-6): 919-924 (2005)

Coauthor Index

1	G. Atwood	[1]
2	G. Kloster	[1]
3	L. Mosley	[1]
4	A. C. Palanduz	[1]

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