L. Garcia-Deiros

	2010
2		S. Fransi, G. L. Farre, L. Garcia-Deiros, Salvador Manich: Design and implementation of Automatic Test Equipment IP module. European Test Symposium 2010: 244
	2007
1		Salvador Manich, L. Garcia-Deiros, Joan Figueras: Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources. IEEE Trans. on CAD of Integrated Circuits and Systems 26(11): 2046-2058 (2007)

Coauthor Index

1	G. L. Farre	[2]
2	Joan Figueras	[1]
3	S. Fransi	[2]
4	Salvador Manich	[1] [2]

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