A. Garavaglia

	2005
2		G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia: Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability 45(5-6): 857-860 (2005)
	2003
1		G. Ghidini, A. Garavaglia, G. Giusto, A. Ghetti, R. Bottini, D. Peschiaroli, M. Scaravaggi, F. Cazzaniga, D. Ielmini: Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET. Microelectronics Reliability 43(8): 1221-1227 (2003)

Coauthor Index

1	R. Bottini	[1] [2]
2	D. Brazzelli	[2]
3	F. Cazzaniga	[1]
4	N. Galbiati	[2]
5	A. Ghetti	[1] [2]
6	G. Ghidini	[1] [2]
7	G. Giusto	[1] [2]
8	D. Ielmini	[1]
9	M. Langenbuch	[2]
10	D. Peschiaroli	[1]
11	M. Scaravaggi	[1]

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