Saakshi Gangwal

	2008
1		Kunhyuk Kang, Saakshi Gangwal, Sang Phill Park, Kaushik Roy: NBTI induced performance degradation in logic and memory circuits: how effectively can we approach a reliability solution? ASP-DAC 2008: 726-731

Coauthor Index

1	Kunhyuk Kang	[1]
2	Sang Phill Park	[1]
3	Kaushik Roy	[1]

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