Kenneth F. Galloway

	2006
2		A. M. Albadri, Ronald D. Schrimpf, Kenneth F. Galloway, D. G. Walker: Single event burnout in power diodes: Mechanisms and models. Microelectronics Reliability 46(2-4): 317-325 (2006)
	2001
1		Loren J. Wise, Ronald D. Schrimpf, Harold G. Parks, Kenneth F. Galloway: A generalized model for the lifetime of microelectronic components, applied to storage conditions. Microelectronics Reliability 41(2): 317-322 (2001)

Coauthor Index

1	A. M. Albadri	[2]
2	Harold G. Parks	[1]
3	Ronald D. Schrimpf	[1] [2]
4	D. G. Walker	[2]
5	Loren J. Wise	[1]

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