Jean Marc Gallière

	2010
6		Jean Marc Gallière, Paolo Rech, Patrick Girard, Luigi Dilillo: A roaming memory test bench for detecting particle induced SEUs. ITC 2010: 810
	2005
5		Ilia Polian, Sandip Kundu, Jean Marc Gallière, Piet Engelke, Michel Renovell, Bernd Becker: Resistive Bridge Fault Model Evolution from Conventional to Ultra Deep Submicron Technologies. VTS 2005: 343-348
4		Jean Marc Gallière, Michel Renovell, Florence Azaïs, Yves Bertrand: Delay Testing Viability of Gate Oxide Short Defects. J. Comput. Sci. Technol. 20(2): 195-200 (2005)
	2003
3		Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand: Delay Testing of MOS Transistor with Gate Oxide Short. Asian Test Symposium 2003: 168-173
2		Michel Renovell, Jean Marc Gallière, Florence Azaïs, Yves Bertrand: Modeling the Random Parameters Effects in a Non-Split Model of Gate Oxide Short. J. Electronic Testing 19(4): 377-386 (2003)
	2001
1		Michel Renovell, Jean Marc Gallière, Florence Azaïs, Serge Bernard, Yves Bertrand: Boolean and current detection of MOS transistor with gate oxide short. ITC 2001: 1039-1048

Coauthor Index

1	Florence Azaïs	[1] [2] [3] [4]
2	Bernd Becker	[5]
3	Serge Bernard	[1]
4	Yves Bertrand	[1] [2] [3] [4]
5	Luigi Dilillo	[6]
6	Piet Engelke	[5]
7	Patrick Girard	[6]
8	Sandip Kundu	[5]
9	Ilia Polian	[5]
10	Paolo Rech	[6]
11	Michel Renovell	[1] [2] [3] [4] [5]

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