J. Galiay

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1980

1 J. Galiay, Yves Crouzet, M. Vergniault: Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability. IEEE Trans. Computers 29(6): 527-531 (1980)

	1980
1		J. Galiay, Yves Crouzet, M. Vergniault: Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability. IEEE Trans. Computers 29(6): 527-531 (1980)

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