N. Galbiati

	2007
3		R. Bottini, S. Costantini, N. Galbiati, A. Ghetti, G. Ghidini, A. Mauri, C. Scozzari, A. Sebastiani: High voltage transistor degradation in NVM pump application. Microelectronics Reliability 47(9-11): 1384-1388 (2007)
	2005
2		G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia: Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability 45(5-6): 857-860 (2005)
	2001
1		N. Galbiati, G. Ghidini, C. Cremonesi, L. Larcher: Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling. Microelectronics Reliability 41(7): 999-1002 (2001)

Coauthor Index

1	R. Bottini	[2] [3]
2	D. Brazzelli	[2]
3	S. Costantini	[3]
4	C. Cremonesi	[1]
5	A. Garavaglia	[2]
6	A. Ghetti	[2] [3]
7	G. Ghidini	[1] [2] [3]
8	G. Giusto	[2]
9	M. Langenbuch	[2]
10	L. Larcher	[1]
11	A. Mauri	[3]
12	C. Scozzari	[3]
13	A. Sebastiani	[3]

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page