Dinesh D. Gaitonde

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1993

1 Dinesh D. Gaitonde, Duncan M. Hank Walker: Test quality and yield analysis using the DEFAM defect to fault mapper. ICCAD 1993: 202-205

	1993
1		Dinesh D. Gaitonde, Duncan M. Hank Walker: Test quality and yield analysis using the DEFAM defect to fault mapper. ICCAD 1993: 202-205

Coauthor Index

1 D. M. H. Walker (Duncan M. Hank Walker) [1]

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