Wolfgang Gös

	2009
3		Stanislav Tyaginov, Viktor Sverdlov, Ivan Starkov, Wolfgang Gös, Tibor Grasser: Impact of O-Si-O bond angle fluctuations on the Si-O bond-breakage rate. Microelectronics Reliability 49(9-11): 998-1002 (2009)
	2008
2		Enzo Ungersboeck, Wolfgang Gös, S. Dhar, Hans Kosina, Siegfried Selberherr: The effect of uniaxial stress on band structure and electron mobility of silicon. Mathematics and Computers in Simulation 79(4): 1071-1077 (2008)
	2007
1		Markus Karner, Andreas Gehring, M. Wagner, R. Entner, Stefan Holzer, Wolfgang Gös, M. Vasicek, Tibor Grasser, Hans Kosina, Siegfried Selberherr: VSP - A gate stack analyzer. Microelectronics Reliability 47(4-5): 704-708 (2007)

Coauthor Index

1	S. Dhar	[2]
2	R. Entner	[1]
3	Andreas Gehring	[1]
4	Tibor Grasser	[1] [3]
5	Stefan Holzer	[1]
6	Markus Karner	[1]
7	Hans Kosina	[1] [2]
8	Siegfried Selberherr	[1] [2]
9	Ivan Starkov	[3]
10	Viktor Sverdlov	[3]
11	Stanislav Tyaginov	[3]
12	Enzo Ungersboeck	[2]
13	M. Vasicek	[1]
14	M. Wagner	[1]

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