U. Gätzschmann

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2006

1 Christian Galke, U. Gätzschmann, Heinrich Theodor Vierhaus: Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes. DSD 2006: 433-438

	2006
1		Christian Galke, U. Gätzschmann, Heinrich Theodor Vierhaus: Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes. DSD 2006: 433-438

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