Andy S. F. Fung

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1981

1 Vinod K. Agarwal, Andy S. F. Fung: Multiple Fault Testing of Large Circuits by Single Fault Test Sets. IEEE Trans. Computers 30(11): 855-865 (1981)

	1981
1		Vinod K. Agarwal, Andy S. F. Fung: Multiple Fault Testing of Large Circuits by Single Fault Test Sets. IEEE Trans. Computers 30(11): 855-865 (1981)

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