 | 2012 |
| 3 |  | Masanori Kurimoto,
Jun Matsushima,
Shigeki Ohbayashi,
Yoshiaki Fukui,
Michio Komoda,
Nobuhiro Tsuda:
A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule.
ACM Trans. Design Autom. Electr. Syst. 17(2): 17 (2012) |
| 2011 |
| 2 |  | Michal Filipek,
Yoshiaki Fukui,
Hiroyuki Iwata,
Grzegorz Mrugalski,
Janusz Rajski,
Masahiro Takakura,
Jerzy Tyszer:
Low Power Decompressor and PRPG with Constant Value Broadcast.
Asian Test Symposium 2011: 84-89 |
| 2010 |
| 1 |  | Masanori Kurimoto,
Jun Matsushima,
Shigeki Ohbayashi,
Yoshiaki Fukui:
A yield improvement methodology based on logic redundant repair with a repairable scan flip-flop designed by push rule.
ISQED 2010: 184-190 |