Daisuke Fujiki

	2009
1		Yuichi Hamamura, Chizu Matsumoto, Yoshiyuki Tsunoda, Koji Kamoda, Yoshio Iwata, Kenji Kanamitsu, Daisuke Fujiki, Fujihiko Kojika, Hiromi Fujita, Yasuo Nakagawa, Shun'ichi Kaneko: Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor Manufacturing. IEICE Transactions 92-C(1): 144-152 (2009)

Coauthor Index

1	Hiromi Fujita	[1]
2	Yuichi Hamamura	[1]
3	Yoshio Iwata	[1]
4	Koji Kamoda	[1]
5	Kenji Kanamitsu	[1]
6	Shun'ichi Kaneko	[1]
7	Fujihiko Kojika	[1]
8	Chizu Matsumoto	[1]
9	Yasuo Nakagawa	[1]
10	Yoshiyuki Tsunoda	[1]

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