Shinji Fujii

	2001
1		Takayuki Yamada, Masaru Moriwaki, Yoshinao Harada, Shinji Fujii, Koji Eriguchi: Effects of the sputtering deposition process of metal gate electrode on the gate dielectric characteristics. Microelectronics Reliability 41(5): 697-704 (2001)

Coauthor Index

1	Koji Eriguchi	[1]
2	Yoshinao Harada	[1]
3	Masaru Moriwaki	[1]
4	Takayuki Yamada	[1]

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