Shinji Fujieda

	2005
1		Shinji Fujieda, Yoshinao Miura, Motofumi Saitoh, Yuden Teraoka, Akitaka Yoshigoe: Characterization of interface defects related to negative-bias temperature instability in ultrathin plasma-nitrided SiON/Si<1 0 0> systems. Microelectronics Reliability 45(1): 57-64 (2005)

Coauthor Index

1	Yoshinao Miura	[1]
2	Motofumi Saitoh	[1]
3	Yuden Teraoka	[1]
4	Akitaka Yoshigoe	[1]

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