Alessandra Fudoli

	2004
7		Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre: Yield Analysis of Logic Circuits. VTS 2004: 103-108
6		Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew: Understanding Yield Losses in Logic Circuits. IEEE Design & Test of Computers 21(3): 208-215 (2004)
5		Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electronic Testing 20(1): 79-87 (2004)
	2003
4		Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante: Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC 2003: 379-385
	2002
3		Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. IOLTW 2002: 206-210
2		Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello: High Accuracy Stimulus Generation for A/D Converter BIST. ITC 2002: 1031-1039
1		Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda: A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. MTDT 2002: 12-16

Coauthor Index

1	Davide Appello	[1] [2] [3] [4] [5] [6] [7]
2	Paolo Bernardi	[4] [5]
3	Fulvio Corno	[1] [3] [5]
4	Katia Giarda	[6] [7]
5	Emil Gizdarski	[6] [7]
6	Ben Mathew	[6] [7]
7	Maurizio Rebaudengo	[1] [3] [4] [5]
8	Matteo Sonza Reorda	[1] [3] [4] [5]
9	Aubin Roy	[2]
10	Stephen K. Sunter (Steve Sunter)	[2]
11	Vincenzo Tancorre	[1] [3] [4] [5] [6] [7]
12	Massimo Violante	[4]

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