 | 2009 |
|---|
| 5 |       | H. Wong,
Y. Fu,
Juin J. Liou,
Y. Yue:
Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors.
Microelectronics Reliability 49(1): 13-16 (2009) |
| 2007 |
|---|
| 4 | | Y. Fu,
H. Wong,
Juin J. Liou:
Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation.
Microelectronics Reliability 47(1): 46-50 (2007) |
| 2006 |
|---|
| 3 | | G. Cheng,
Y. Fu:
Error Estimation of Perturbations Under CRI.
IEEE T. Fuzzy Systems 14(6): 709-715 (2006) |
| 2 | | Y. Fu,
N. Zheng:
M-Face: An Appearance-Based Photorealistic Model for Multiple Facial Attributes Rendering.
IEEE Trans. Circuits Syst. Video Techn. 16(7): 830-842 (2006) |
| 2000 |
|---|
| 1 | | Huazhong Shu,
Limin Luo,
Wenxue Yu,
Y. Fu:
A new fast method for computing Legendre moments.
Pattern Recognition 33(2): 341-348 (2000) |
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