Tony Fryars

	2004
2		Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington: Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC 2004: 355-364
	1999
1		Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski: Logic BIST for large industrial designs: real issues and case studies. ITC 1999: 358-367

Coauthor Index

1	Kenneth M. Butler	[2]
2	Abu S. M. Hassan	[1]
3	Graham Hetherington	[1] [2]
4	Mark Kassab	[1]
5	Janusz Rajski	[1]
6	Jayashree Saxena	[2]
7	Nagesh Tamarapalli	[1]

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