S. G. From

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1993

2 H. A. Farhat, S. G. From: A beta model for estimating the testability and coverage distributions of a VLSI circuit. IEEE Trans. on CAD of Integrated Circuits and Systems 12(4): 550-554 (1993)

1992

1 H. A. Farhat, S. G. From, Antonio Lioy: A quadratic programming approach to estimating the testability and coverage distributions of a VLSI circuit. Microprocessing and Microprogramming 35(1-5): 479-483 (1992)

	1993
2		H. A. Farhat, S. G. From: A beta model for estimating the testability and coverage distributions of a VLSI circuit. IEEE Trans. on CAD of Integrated Circuits and Systems 12(4): 550-554 (1993)
	1992
1		H. A. Farhat, S. G. From, Antonio Lioy: A quadratic programming approach to estimating the testability and coverage distributions of a VLSI circuit. Microprocessing and Microprogramming 35(1-5): 479-483 (1992)

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