L. Frisk

	2010
4		J. Virkki, T. Seppälä, L. Frisk, P. Heino: Accelerated testing for failures of tantalum capacitors. Microelectronics Reliability 50(2): 217-219 (2010)
3		J. Virkki, A. Koskenkorva, L. Frisk: Development of a matrix test board for capacitor reliability testing. Microelectronics Reliability 50(9-11): 1711-1714 (2010)
	2005
2		L. Frisk, Eero Ristolainen: Flip chip attachment on flexible LCP substrate using an ACF. Microelectronics Reliability 45(3-4): 583-588 (2005)
	2002
1		L. Frisk, J. Järvinen, R. Ristolainen: Chip on flex attachment with thermoplastic ACF for RFID applications. Microelectronics Reliability 42(9-11): 1559-1562 (2002)

Coauthor Index

1	P. Heino	[4]
2	J. Järvinen	[1]
3	A. Koskenkorva	[3]
4	Eero Ristolainen	[2]
5	R. Ristolainen	[1]
6	T. Seppälä	[4]
7	J. Virkki	[3] [4]

Colors in the list of coauthors

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page