Lothar Frey

	2011
5		Guntrade Roll, Matthias Goldbach, Lothar Frey: Leakage current and defect characterization of p+n-source/drain diodes. Microelectronics Reliability 51(12): 2081-2085 (2011)
4		Martin Le-Huu, Holger Schmitt, Stefan Noll, Michael Grieb, Frederik F. Schrey, Anton J. Bauer, Lothar Frey, Heiner Ryssel: Investigation of the reliability of 4H-SiC MOS devices for high temperature applications. Microelectronics Reliability 51(8): 1346-1350 (2011)
	2005
3		Martin Lemberger, Albena Paskaleva, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel: Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursor. Microelectronics Reliability 45(5-6): 819-822 (2005)
	2003
2		Albena Paskaleva, Martin Lemberger, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel: Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors. Microelectronics Reliability 43(8): 1253-1257 (2003)
	2001
1		M. P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel: Electrical reliability aspects of through the gate implanted MOS structures with thin oxides. Microelectronics Reliability 41(7): 987-990 (2001)

Coauthor Index

1	Anton J. Bauer	[1] [2] [3] [4]
2	Matthias Goldbach	[5]
3	Michael Grieb	[4]
4	M. P. M. Jank	[1]
5	Martin Le-Huu	[4]
6	Martin Lemberger	[1] [2] [3]
7	Stefan Noll	[4]
8	Albena Paskaleva	[2] [3]
9	Guntrade Roll	[5]
10	Heiner Ryssel	[1] [2] [3] [4]
11	Holger Schmitt	[4]
12	Frederik F. Schrey	[4]
13	Stefan Zürcher	[2] [3]

Colors in the list of coauthors

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page