 | 1996 |
|---|
| 7 |       | Piero Franco,
Siyad C. Ma,
Jonathan Chang,
Yi-Chin Chu,
Sanjay Wattal,
Edward J. McCluskey,
Robert L. Stokes,
William D. Farwell:
Analysis and Detection of Timing Failures in an Experimental Test Chip.
ITC 1996: 691-700 |
| 1995 |
|---|
| 6 | | Piero Franco,
William D. Farwell,
Robert L. Stokes,
Edward J. McCluskey:
An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design.
ITC 1995: 653-662 |
| 5 | | Siyad C. Ma,
Piero Franco,
Edward J. McCluskey:
An Experimental Chip to Evaluate Test Techniques: Experiment Results.
ITC 1995: 663-672 |
| 1992 |
|---|
| 4 | | Nirmal R. Saxena,
Piero Franco,
Edward J. McCluskey:
Simple Bounds on Serial Signature Analysis Aliasing for Random Testing.
IEEE Trans. Computers 41(5): 638-645 (1992) |
| 1991 |
|---|
| 3 | | Nirmal R. Saxena,
Piero Franco,
Edward J. McCluskey:
Bounds on Signature Analysis Aliasing for Random Testing.
FTCS 1991: 104-113 |
| 2 | | Piero Franco,
Edward J. McCluskey:
Delay Testing of Digital Circuits by Output Waveform Analysis.
ITC 1991: 798-807 |
| 1 | | Nirmal R. Saxena,
Piero Franco,
Edward J. McCluskey:
Refined Bounds on Signature Analysis Aliasing for Random Testing.
ITC 1991: 818-827 |
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