 | 2010 |
| 8 |  | Denis Teixeira Franco,
Maí Correia Vasconcelos,
Lirida A. B. Naviner,
Jean-François Naviner:
On evaluating the signal reliability of self-checking arithmetic circuits.
SBCCI 2010: 109-114 |
| 2008 |
| 7 |  | Denis Teixeira Franco,
Maí Correia Vasconcelos,
Lirida A. B. Naviner,
Jean-François Naviner:
Signal probability for reliability evaluation of logic circuits.
Microelectronics Reliability 48(8-9): 1586-1591 (2008) |
| 6 |  | Maí C. R. de Vasconcelos,
Denis Teixeira Franco,
Lirida A. B. Naviner,
Jean-François Naviner:
Relevant metrics for evaluation of concurrent error detection schemes.
Microelectronics Reliability 48(8-9): 1601-1603 (2008) |
| 2006 |
| 5 |  | Denis Teixeira Franco,
Jean-François Naviner,
Lirida A. B. Naviner:
Yield and reliability issues in nanoelectronic technologies.
Annales des Télécommunications 61(11-12): 1422-1457 (2006) |
| 2003 |
| 4 |  | Luigi Carro,
Marcelo Negreiros,
Gabriel Parmegiani Jahn,
Adão Antônio de Souza Jr.,
Denis Teixeira Franco:
Circuit-Level Considerations for Mixed-Signal Programmable Components.
IEEE Design & Test of Computers 20(1): 76-84 (2003) |
| 2000 |
| 3 |  | Luigi Carro,
Adão Antônio de Souza Jr.,
Marcelo Negreiros,
Gabriel Parmegiani Jahn,
Denis Teixeira Franco:
Non-Linear Components for Mixed Circuits Analog Front-End.
DATE 2000: 544-549 |
| 2 |  | Luigi Carro,
Denis Teixeira Franco:
FPGA Based Systems with Linear and Non-Linear Signal Processing Capabilities.
EUROMICRO 2000: 1260- |
| 1 |  | Denis Teixeira Franco,
Luigi Carro:
FPGA Architecture Comparison for Non-Conventional Signal Processing.
IJCNN (2) 2000: 55-58 |