R. France

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1984

1 D. Leet, P. Shearon, R. France: A CMOS LSSD Test Generation System. IBM Journal of Research and Development 28(5): 625-635 (1984)

	1984
1		D. Leet, P. Shearon, R. France: A CMOS LSSD Test Generation System. IBM Journal of Research and Development 28(5): 625-635 (1984)

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