 | 2007 |
|---|
| 4 |       | M. Lanza,
M. Porti,
M. Nafría,
Guenther Benstetter,
Werner Frammelsberger,
H. Ranzinger,
E. Lodermeier,
G. Jaschke:
Influence of the manufacturing process on the electrical properties of thin (k stacks observed with CAFM.
Microelectronics Reliability 47(9-11): 1424-1428 (2007) |
| 2006 |
|---|
| 3 | | W. Bergbauer,
T. Lutz,
Werner Frammelsberger,
Guenther Benstetter:
Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures.
Microelectronics Reliability 46(9-11): 1736-1740 (2006) |
| 2005 |
|---|
| 2 | | Peter Breitschopf,
Guenther Benstetter,
Bernhard Knoll,
Werner Frammelsberger:
Intermittent contact scanning capacitance microscopy-An improved method for 2D doping profiling.
Microelectronics Reliability 45(9-11): 1568-1571 (2005) |
| 2003 |
|---|
| 1 | | Werner Frammelsberger,
Guenther Benstetter,
Thomas Schweinboeck,
Richard J. Stamp,
Janice Kiely:
Characterization of thin and ultra-thin SiO2 films and SiO2/Si interfaces with combined conducting and topographic atomic force microscopy.
Microelectronics Reliability 43(9-11): 1465-1470 (2003) |
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