Hélène Frémont

	2011
13		A. Aubert, S. Jacques, S. Pétremont, Nathalie Labat, Hélène Frémont: Experimental power cycling on insulated TRIAC package: Reliability interpretation thanks to an innovative failure analysis flow. Microelectronics Reliability 51(9-11): 1845-1849 (2011)
12		Lutz Meinshausen, Kirsten Weide-Zaage, Hélène Frémont: Migration induced material transport in Cu-Sn IMC and SnAgCu microbumps. Microelectronics Reliability 51(9-11): 1860-1864 (2011)
	2010
11		Xiaosong Ma, Kaspar M. B. Jansen, G. Q. Zhang, Willem D. van Driel, Olaf van der Sluis, Leo J. Ernst, C. Regards, Christian Gautier, Hélène Frémont: A fast moisture sensitivity level qualification method. Microelectronics Reliability 50(9-11): 1654-1660 (2010)
10		A. Aubert, J. P. Rebrasse, L. Dantas de Morais, Nathalie Labat, Hélène Frémont: Failure analysis case study on a Cu/low-k technology in package: New front-side approach using laser and plasma de-processing. Microelectronics Reliability 50(9-11): 1688-1691 (2010)
9		Pascal Lecuyer, Hélène Frémont, Jean-Pierre Landesman, Manoubi Auguste Bahi: Wearout estimation using the Robustness Validation methodology for components in 150 degreeC ambient automotive applications. Microelectronics Reliability 50(9-11): 1744-1749 (2010)
	2009
8		M. Berthou, P. Retailleau, Hélène Frémont, A. Guédon-Gracia, C. Jéphos-Davennel: Microstructure evolution observation for SAC solder joint: Comparison between thermal cycling and thermal storage. Microelectronics Reliability 49(9-11): 1267-1272 (2009)
7		Manoubi Auguste Bahi, Hélène Frémont, Jean-Pierre Landesman, Annabelle Gentil, Pascal Lecuyer: A new methodology for the identification of ball bond degradation during high-temperature aging tests on devices in standard plastic packages. Microelectronics Reliability 49(9-11): 1273-1277 (2009)
6		Charles Regard, Christian Gautier, Hélène Frémont, Patrick Poirier, Xiaosong Ma, Kaspar M. B. Jansen: Fast reliability qualification of SiP products. Microelectronics Reliability 49(9-11): 958-962 (2009)
	2007
5		Kirsten Weide-Zaage, David Dalleau, Yves Danto, Hélène Frémont: Dynamic void formation in a DD-copper-structure with different metallization geometry. Microelectronics Reliability 47(2-3): 319-325 (2007)
4		W. C. Maia Filho, M. Brizoux, Hélène Frémont, Yves Danto: Torsion test applied for reballing and solder paste volume evaluation. Microelectronics Reliability 47(9-11): 1663-1667 (2007)
3		Manoubi Auguste Bahi, Pascal Lecuyer, Hélène Frémont, Jean-Pierre Landesman: Sequential environmental stresses tests qualification for automotive components. Microelectronics Reliability 47(9-11): 1680-1684 (2007)
	2006
2		W. C. Maia Filho, M. Brizoux, Hélène Frémont, Yves Danto: Improved physical understanding of intermittent failure in continuous monitoring method. Microelectronics Reliability 46(9-11): 1886-1891 (2006)
	2005
1		Kirsten Weide-Zaage, Walter Horaud, Hélène Frémont: Moisture diffusion in Printed Circuit Boards: Measurements and Finite- Element- Simulations. Microelectronics Reliability 45(9-11): 1662-1667 (2005)

Coauthor Index

1	A. Aubert	[10] [13]
2	Manoubi Auguste Bahi	[3] [7] [9]
3	M. Berthou	[8]
4	M. Brizoux	[2] [4]
5	David Dalleau	[5]
6	Yves Danto (Y. Danto)	[2] [4] [5]
7	Willem D. van Driel (W. D. van Driel)	[11]
8	Leo J. Ernst (L. J. Ernst)	[11]
9	W. C. Maia Filho	[2] [4]
10	Christian Gautier	[6] [11]
11	Annabelle Gentil	[7]
12	A. Guédon-Gracia	[8]
13	Walter Horaud	[1]
14	S. Jacques	[13]
15	Kaspar M. B. Jansen	[6] [11]
16	C. Jéphos-Davennel	[8]
17	Nathalie Labat	[10] [13]
18	Jean-Pierre Landesman	[3] [7] [9]
19	Pascal Lecuyer	[3] [7] [9]
20	Xiaosong Ma	[6] [11]
21	Lutz Meinshausen	[12]
22	L. Dantas de Morais	[10]
23	S. Pétremont	[13]
24	Patrick Poirier	[6]
25	J. P. Rebrasse	[10]
26	Charles Regard	[6]
27	C. Regards	[11]
28	P. Retailleau	[8]
29	Olaf van der Sluis	[11]
30	Kirsten Weide-Zaage	[1] [5] [12]
31	G. Q. Zhang (G. Q. (Kouchi) Zhang)	[11]

Colors in the list of coauthors

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page