Brian Foutz

	2010
4		Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, R. Malneedi, Thomas J. Snethen, Vikram Iyengar, David E. Lackey, Gary Grise: Low cost at-speed testing using On-Product Clock Generation compatible with test compression. ITC 2010: 724-733
3		Anis Uzzaman, Brion L. Keller, Brian Foutz, Sandeep Bhatia, Thomas Bartenstein, Masayuki Arai, Kazuhiko Iwasaki: Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression. IEICE Transactions 93-D(1): 17-23 (2010)
	2004
2		Vivek Chickermane, Brian Foutz, Brion L. Keller: Channel Masking Synthesis for Efficient On-Chip Test Compression. ITC 2004: 452-461
	2002
1		Martin Foltin, Brian Foutz, Sean Tyler: Efficient stimulus independent timing abstraction model based on a new concept of circuit block transparency. DAC 2002: 158-163

Coauthor Index

1	Masayuki Arai	[3]
2	Thomas Bartenstein	[3]
3	Sandeep Bhatia	[3]
4	Krishna Chakravadhanula	[4]
5	Vivek Chickermane	[2] [4]
6	Martin Foltin	[1]
7	Gary Grise	[4]
8	Kazuhiko Iwasaki	[3]
9	Vikram Iyengar	[4]
10	Brion L. Keller	[2] [3] [4]
11	David E. Lackey	[4]
12	R. Malneedi	[4]
13	Thomas J. Snethen	[4]
14	Sean Tyler	[1]
15	Anis Uzzaman	[3]

Colors in the list of coauthors

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page