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Pascal Fouillat Coauthor index pubzone.org

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17Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLTimothée Levi, Jean Tomas, Noëlle Lewis, Pascal Fouillat: A CMOS Resizing Methodology for Analog Circuits. IEEE Design & Test of Computers 26(1): 78-87 (2009)
2008
16Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVincent Pouget, Alexandre Douin, Gilles Foucard, Paul Peronnard, Dean Lewis, Pascal Fouillat, Raoul Velazco: Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection. IOLTS 2008: 295-301
15Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAziz Machouat, G. Haller, Vincent Goubier, Dean Lewis, Philippe Perdu, Vincent Pouget, Pascal Fouillat, F. Essely: Effect of physical defect on shmoos in CMOS DSM technologies. Microelectronics Reliability 48(8-9): 1333-1338 (2008)
2006
14Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Douin, Vincent Pouget, M. De Matos, Dean Lewis, Philippe Perdu, Pascal Fouillat: Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation. Microelectronics Reliability 46(9-11): 1514-1519 (2006)
2005
13Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAlexandre Douin, Vincent Pouget, Dean Lewis, Pascal Fouillat, Philippe Perdu: Electrical Modeling for Laser Testing with Different Pulse Durations. IOLTS 2005: 9-13
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAbdellatif Firiti, Felix Beaudoin, G. Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat: Impact of semiconductors material on IR Laser Stimulation signal. Microelectronics Reliability 45(9-11): 1465-1470 (2005)
2004
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVincent Pouget, Dean Lewis, Pascal Fouillat: Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. IEEE T. Instrumentation and Measurement 53(4): 1227-1231 (2004)
2003
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLT. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Y. Danto: A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability 43(1): 173-177 (2003)
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLT. Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, M. Bafleur, D. Trémouilles: Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization. Microelectronics Reliability 43(3): 439-444 (2003)
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLT. Beauchêne, D. Trémouilles, Dean Lewis, Philippe Perdu, Pascal Fouillat: Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS). Microelectronics Reliability 43(9-11): 1577-1582 (2003)
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLF. Darracq, Hervé Lapuyade, Nadine Buard, Pascal Fouillat, R. Dufayel, Thierry Carrière: Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectronics Reliability 43(9-11): 1615-1619 (2003)
2001
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDean Lewis, Hervé Lapuyade, Yann Deval, Y. Maidon, F. Darracq, R. Briand, Pascal Fouillat: A New Laser System for X-Rays Flashes Sensitivity Evaluation. IOLTW 2001: 111-
5no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDean Lewis, Vincent Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu: Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability 41(9-10): 1471-1476 (2001)
4no EE pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVincent Pouget, Hervé Lapuyade, Pascal Fouillat, Dean Lewis, S. Buchner: Theoretical Investigation of an Equivalent Laser LET. Microelectronics Reliability 41(9-10): 1513-1518 (2001)
2000
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLVincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet: An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW 2000: 52-
1999
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLJean Tomas, Yann Deval, Jean-Baptiste Begueret, Pascal Fouillat, J. L. Aucouturier: A New Industrial Approach Compatible With Microelectronics Education: Application to an RF System Design. MSE 1999: 37-38
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLThomas Zimmer, N. Milet-Lewis, Ahmed Fakhfakh, B. Ardouin, Hervé Levi, J. B. Duluc, Pascal Fouillat: Hierarchical Analogue Design and Behavioural Modelling. MSE 1999: 59-60

Coauthor Index

1B. Ardouin [1]
2J. L. Aucouturier [2]
3M. Bafleur [9]
4T. Beauchêne [5] [8] [9] [10]
5Felix Beaudoin [5] [9] [10] [12]
6Jean-Baptiste Begueret [2]
7R. Briand [6]
8Nadine Buard [7]
9S. Buchner [4]
10Thierry Carrière [7]
11Yves Danto (Y. Danto) [10]
12F. Darracq [6] [7]
13Romain Desplats [9]
14Yann Deval [2] [6]
15Alexandre Douin [13] [14] [16]
16R. Dufayel [7]
17J. B. Duluc [1]
18S. Duzellier [3]
19R. Ecoffet [3]
20F. Essely [15]
21Ahmed Fakhfakh [1]
22Abdellatif Firiti [12]
23Gilles Foucard [16]
24Vincent Goubier [15]
25Gerald Haller (G. Haller) [12] [15]
26Hervé Lapuyade [3] [4] [5] [6] [7]
27Hervé Levi [1]
28Timothée Levi [17]
29Dean Lewis [3] [4] [5] [6] [8] [9] [10] [11] [12] [13] [14] [15] [16]
30Noëlle Lewis [17]
31Aziz Machouat [15]
32Y. Maidon [6]
33M. De Matos [14]
34N. Milet-Lewis [1]
35Philippe Perdu [5] [8] [9] [10] [12] [13] [14] [15]
36Paul Peronnard [16]
37Vincent Pouget [3] [4] [5] [9] [10] [11] [13] [14] [15] [16]
38F. M. Roche [3]
39L. Sarger [3]
40Jean Tomas [2] [17]
41André Touboul [5]
42D. Trémouilles (David Trémouilles) [8] [9]
43Raoul Velazco [16]
44Thomas Zimmer [1]

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