 | 2009 |
| 17 |  | Timothée Levi,
Jean Tomas,
Noëlle Lewis,
Pascal Fouillat:
A CMOS Resizing Methodology for Analog Circuits.
IEEE Design & Test of Computers 26(1): 78-87 (2009) |
| 2008 |
| 16 |  | Vincent Pouget,
Alexandre Douin,
Gilles Foucard,
Paul Peronnard,
Dean Lewis,
Pascal Fouillat,
Raoul Velazco:
Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection.
IOLTS 2008: 295-301 |
| 15 |  | Aziz Machouat,
G. Haller,
Vincent Goubier,
Dean Lewis,
Philippe Perdu,
Vincent Pouget,
Pascal Fouillat,
F. Essely:
Effect of physical defect on shmoos in CMOS DSM technologies.
Microelectronics Reliability 48(8-9): 1333-1338 (2008) |
| 2006 |
| 14 |  | Alexandre Douin,
Vincent Pouget,
M. De Matos,
Dean Lewis,
Philippe Perdu,
Pascal Fouillat:
Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.
Microelectronics Reliability 46(9-11): 1514-1519 (2006) |
| 2005 |
| 13 |  | Alexandre Douin,
Vincent Pouget,
Dean Lewis,
Pascal Fouillat,
Philippe Perdu:
Electrical Modeling for Laser Testing with Different Pulse Durations.
IOLTS 2005: 9-13 |
| 12 |  | Abdellatif Firiti,
Felix Beaudoin,
G. Haller,
Philippe Perdu,
Dean Lewis,
Pascal Fouillat:
Impact of semiconductors material on IR Laser Stimulation signal.
Microelectronics Reliability 45(9-11): 1465-1470 (2005) |
| 2004 |
| 11 |  | Vincent Pouget,
Dean Lewis,
Pascal Fouillat:
Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC.
IEEE T. Instrumentation and Measurement 53(4): 1227-1231 (2004) |
| 2003 |
| 10 |  | T. Beauchêne,
Dean Lewis,
Felix Beaudoin,
Vincent Pouget,
Philippe Perdu,
Pascal Fouillat,
Y. Danto:
A physical approach on SCOBIC investigation in VLSI.
Microelectronics Reliability 43(1): 173-177 (2003) |
| 9 |  | T. Beauchêne,
Dean Lewis,
Felix Beaudoin,
Vincent Pouget,
Romain Desplats,
Pascal Fouillat,
Philippe Perdu,
M. Bafleur,
D. Trémouilles:
Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.
Microelectronics Reliability 43(3): 439-444 (2003) |
| 8 |  | T. Beauchêne,
D. Trémouilles,
Dean Lewis,
Philippe Perdu,
Pascal Fouillat:
Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS).
Microelectronics Reliability 43(9-11): 1577-1582 (2003) |
| 7 |  | F. Darracq,
Hervé Lapuyade,
Nadine Buard,
Pascal Fouillat,
R. Dufayel,
Thierry Carrière:
Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.
Microelectronics Reliability 43(9-11): 1615-1619 (2003) |
| 2001 |
| 6 |  | Dean Lewis,
Hervé Lapuyade,
Yann Deval,
Y. Maidon,
F. Darracq,
R. Briand,
Pascal Fouillat:
A New Laser System for X-Rays Flashes Sensitivity Evaluation.
IOLTW 2001: 111- |
| 5 |  | Dean Lewis,
Vincent Pouget,
T. Beauchêne,
Hervé Lapuyade,
Pascal Fouillat,
André Touboul,
Felix Beaudoin,
Philippe Perdu:
Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.
Microelectronics Reliability 41(9-10): 1471-1476 (2001) |
| 4 |  | Vincent Pouget,
Hervé Lapuyade,
Pascal Fouillat,
Dean Lewis,
S. Buchner:
Theoretical Investigation of an Equivalent Laser LET.
Microelectronics Reliability 41(9-10): 1513-1518 (2001) |
| 2000 |
| 3 |  | Vincent Pouget,
Pascal Fouillat,
Dean Lewis,
Hervé Lapuyade,
L. Sarger,
F. M. Roche,
S. Duzellier,
R. Ecoffet:
An Overview of the Applications of a Pulsed Laser System for SEU Testing.
IOLTW 2000: 52- |
| 1999 |
| 2 |  | Jean Tomas,
Yann Deval,
Jean-Baptiste Begueret,
Pascal Fouillat,
J. L. Aucouturier:
A New Industrial Approach Compatible With Microelectronics Education: Application to an RF System Design.
MSE 1999: 37-38 |
| 1 |  | Thomas Zimmer,
N. Milet-Lewis,
Ahmed Fakhfakh,
B. Ardouin,
Hervé Levi,
J. B. Duluc,
Pascal Fouillat:
Hierarchical Analogue Design and Behavioural Modelling.
MSE 1999: 59-60 |