B. Foucher

	2009
6		F. Molière, B. Foucher, Philippe Perdu, A. Bravaix: Analysis of deep submicron VLSI technological risks: A new qualification process for professional electronics. Microelectronics Reliability 49(9-11): 1381-1385 (2009)
	2007
5		E. Scanff, K. L. Feldman, S. Ghelam, Peter Sandborn, M. Glade, B. Foucher: Life cycle cost impact of using prognostic health management (PHM) for helicopter avionics. Microelectronics Reliability 47(12): 1857-1864 (2007)
	2006
4		B. Foucher, J. Tomas, F. Mounsi, M. Jeremias: Life margin assessment with Physics of Failure Tools application to BGA packages. Microelectronics Reliability 46(5-6): 1013-1018 (2006)
	2002
3		B. Foucher, J. Boullié, B. Meslet, D. Das: A review of reliability prediction methods for electronic devices. Microelectronics Reliability 42(8): 1155-1162 (2002)
2		P. Galy, V. Berland, B. Foucher, A. Guilhaume, J. P. Chante, S. Bardy, F. Blanc: Experimental and 3D simulation correlation of a gg-nMOS transistor under high current pulse. Microelectronics Reliability 42(9-11): 1299-1302 (2002)
	2001
1		A. Guilhaume, P. Galy, J. P. Chante, B. Foucher, F. Blanc: Simulation and experimental comparison of GGNMOS and LVTSCR protection cells under ElectroStatic Discharges. Microelectronics Reliability 41(9-10): 1433-1437 (2001)

Coauthor Index

1	S. Bardy	[2]
2	V. Berland	[2]
3	F. Blanc	[1] [2]
4	J. Boullié	[3]
5	A. Bravaix	[6]
6	J. P. Chante	[1] [2]
7	D. Das	[3]
8	K. L. Feldman	[5]
9	P. Galy	[1] [2]
10	S. Ghelam	[5]
11	M. Glade	[5]
12	A. Guilhaume	[1] [2]
13	M. Jeremias	[4]
14	B. Meslet	[3]
15	F. Molière	[6]
16	F. Mounsi	[4]
17	Philippe Perdu	[6]
18	Peter Sandborn	[5]
19	E. Scanff	[5]
20	J. Tomas	[4]

Colors in the list of coauthors

Last update Wed May 30 22:34:44 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page